Hiroyuki Naraidate

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Iwate, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface inspection apparatus and surface inspection method
- Patent number 7,403,278
- Issue date Jul 22, 2008
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection apparatus
- Patent number 7,149,341
- Issue date Dec 12, 2006
- Toshiba Ceramics Co., Ltd.
- Yoshinori Hayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD
- Publication number 20070222977
- Publication date Sep 27, 2007
- SHIBAURA MECHATRONICS CORPORATION
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection apparatus
- Publication number 20030169916
- Publication date Sep 11, 2003
- TOSHIBA CERAMICS CO., LTD.
- Yoshinori Hayashi
- G01 - MEASURING TESTING