Hiroyuki Nishida

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wavefront measuring apparatus and wavefront measuring method
- Patent number 6,967,724
- Issue date Nov 22, 2005
- Olympus Corporation
- Hiroyuki Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Objective lens, combination of objective lenses, and method for adj...
- Patent number 6,831,792
- Issue date Dec 14, 2004
- Olympus Corporation
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Grant
Wavefront measuring apparatus and wavefront measuring method
- Patent number 6,785,006
- Issue date Aug 31, 2004
- Olympus Corporation
- Hiroyuki Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter and illumination optical system provided with same
- Patent number 6,671,089
- Issue date Dec 30, 2003
- Olympus Optical Co., Ltd.
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Grant
Microscopic optical system
- Patent number 6,493,138
- Issue date Dec 10, 2002
- Olympus Optical Co., Ltd.
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Grant
Ultraviolet microscope optical system and optical filter used in th...
- Patent number 6,339,498
- Issue date Jan 15, 2002
- Olympus Optical Co., Ltd.
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Grant
Confocal microscope
- Patent number 6,188,514
- Issue date Feb 13, 2001
- Olympus Optical Co., Ltd.
- Yoshiharu Saito
- G02 - OPTICS
Information Patent Grant
Confocal microscope and relay optical system for use in confocal mi...
- Patent number 6,157,484
- Issue date Dec 5, 2000
- Olympus Optical Co., Ltd.
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Grant
Scanning probe microscope incorporating an optical microscope
- Patent number 5,952,562
- Issue date Sep 14, 1999
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Illumination optical system
- Patent number 5,880,861
- Issue date Mar 9, 1999
- Olympus Optical Co., Ltd.
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Grant
Microscope optical system
- Patent number 5,729,385
- Issue date Mar 17, 1998
- Olympus Optical Co., Ltd.
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Grant
Automatic focus detection device for microscopes
- Patent number 5,710,662
- Issue date Jan 20, 1998
- Olympus Optical Co., Ltd.
- Hiroyuki Nishida
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Wavefront measuring apparatus and wavefront measuring method
- Publication number 20040257584
- Publication date Dec 23, 2004
- Hiroyuki Nishida
- G01 - MEASURING TESTING
Information Patent Application
Objective lens, combination of objective lenses, and method for adj...
- Publication number 20030179461
- Publication date Sep 25, 2003
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Application
Wavefront measuring apparatus and wavefront measuring method
- Publication number 20020118370
- Publication date Aug 29, 2002
- Hiroyuki Nishida
- G01 - MEASURING TESTING
Information Patent Application
Optical filter and illumination optical system provided with same
- Publication number 20020063955
- Publication date May 30, 2002
- Olympus Optical Co., Ltd.
- Hiroyuki Nishida
- G02 - OPTICS
Information Patent Application
Microscopic optical system
- Publication number 20010026397
- Publication date Oct 4, 2001
- Hiroyuki Nishida
- G02 - OPTICS

Hiroyuki Nishida

Person

Patents Grantslast 30 patents

Wavefront measuring apparatus and wavefront measuring method

Objective lens, combination of objective lenses, and method for adj...

Wavefront measuring apparatus and wavefront measuring method

Optical filter and illumination optical system provided with same

Microscopic optical system

Ultraviolet microscope optical system and optical filter used in th...

Confocal microscope

Confocal microscope and relay optical system for use in confocal mi...

Scanning probe microscope incorporating an optical microscope

Illumination optical system

Microscope optical system

Automatic focus detection device for microscopes

Patents Applicationslast 30 patents

Wavefront measuring apparatus and wavefront measuring method

Objective lens, combination of objective lenses, and method for adj...

Wavefront measuring apparatus and wavefront measuring method

Optical filter and illumination optical system provided with same

Microscopic optical system