Hiroyuki Satoyoshi

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical-scanning-height measuring device
- Patent number 10,739,580
- Issue date Aug 11, 2020
- Keyence Corporation
- Tatsuro Homma
- G01 - MEASURING TESTING
Information Patent Grant
Height and dimension measuring device that measures a height and di...
- Patent number 10,641,598
- Issue date May 5, 2020
- Keyence Corporation
- Tatsuro Homma
- G02 - OPTICS
Information Patent Grant
Shape measuring device
- Patent number 10,466,042
- Issue date Nov 5, 2019
- Keyence Corporation
- Hiroyuki Satoyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Optical displacement measurement system, imaging condition optimiza...
- Patent number 9,866,747
- Issue date Jan 9, 2018
- Keyence Corporation
- Hiroyuki Satoyoshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical displacement meter, optical displacement measuring method,...
- Patent number 7,751,065
- Issue date Jul 6, 2010
- Keyence Corporation
- Yoshiaki Nishio
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Shape Measuring Device
- Publication number 20190113335
- Publication date Apr 18, 2019
- KEYENCE CORPORATION
- Hiroyuki Satoyoshi
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Measuring Device
- Publication number 20180180400
- Publication date Jun 28, 2018
- KEYENCE CORPORATION
- Tatsuro Homma
- G01 - MEASURING TESTING
Information Patent Application
Optical-Scanning-Height Measuring Device
- Publication number 20180180876
- Publication date Jun 28, 2018
- KEYENCE CORPORATION
- Tatsuro Homma
- G02 - OPTICS
Information Patent Application
Optical Displacement Measurement System, Imaging Condition Optimiza...
- Publication number 20160261791
- Publication date Sep 8, 2016
- KEYENCE CORPORATION
- Hiroyuki SATOYOSHI
- G01 - MEASURING TESTING
Information Patent Application
Optical displacement meter, optical displacement measuring method,...
- Publication number 20080094643
- Publication date Apr 24, 2008
- KEYENCE CORPORATION
- Yoshiaki Nishio
- G01 - MEASURING TESTING