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Hiroyuki Sawamura
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Kami-niikawagun, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement fluctuation suppressing pressure sensor device
Patent number
10,718,679
Issue date
Jul 21, 2020
Hokuriku Electric Industry Co., Ltd.
Hiroyuki Sawamura
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure sensor device
Patent number
10,006,826
Issue date
Jun 26, 2018
Hokuriku Electric Industry Co., Ltd.
Satoshi Tsubata
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Force sensor
Patent number
D629320
Issue date
Dec 21, 2010
Hokuriku Electric Industry Co., Ltd.
Hiroyuki Sawamura
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Semiconductor force sensor
Patent number
7,360,440
Issue date
Apr 22, 2008
Hokuriku Electric Industry Co., Ltd.
Shigeru Hirose
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor force sensor
Patent number
7,234,359
Issue date
Jun 26, 2007
Hokuriku Electric Industry Co., Ltd.
Shigeru Hirose
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PRESSURE SENSOR DEVICE
Publication number
20190137351
Publication date
May 9, 2019
HOKURIKU ELECTRIC INDUSTRY CO., LTD.
Hiroyuki Sawamura
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR PRESSURE SENSOR DEVICE
Publication number
20170328802
Publication date
Nov 16, 2017
HOKURIKU ELECTRIC INDUSTRY CO., LTD.
Satoshi Tsubata
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SEMICONDUCTOR FORCE SENSOR
Publication number
20070234827
Publication date
Oct 11, 2007
HOKURIKU ELECTRIC INDUSTRY CO., LTD.
Shigeru Hirose
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor force sensor
Publication number
20050217386
Publication date
Oct 6, 2005
Hokuriku Electric Industry Co.,
Shigeru Hirose
G01 - MEASURING TESTING