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Hiroyuki Sekine
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Saitama, JP
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last 30 patents
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Patent Grant
Device, method, program, and recording medium for error factor dete...
Patent number
8,076,947
Issue date
Dec 13, 2011
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
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Patent Application
DEVICE, METHOD, PROGRAM, AND RECORDING MEDIUM FOR ERROR FACTOR DETE...
Publication number
20100225301
Publication date
Sep 9, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING