Hiroyuki Shindo

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection with images of different synthesis ratios
- Patent number 12,211,194
- Issue date Jan 28, 2025
- HITACHI HIGH-TECH CORPORATION
- Yasushi Ebizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and measurement apparatus
- Patent number 12,125,176
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Kosuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image recognition device and method
- Patent number 12,014,530
- Issue date Jun 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryou Yumiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing system and computer program for performing image p...
- Patent number 11,836,906
- Issue date Dec 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection system
- Patent number 11,587,225
- Issue date Feb 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Shuyang Dou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern height information correction system and pattern height inf...
- Patent number 11,448,663
- Issue date Sep 20, 2022
- HITACHI HIGH-TECH CORPORATION
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Image processing system and computer program for performing image p...
- Patent number 11,176,405
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection system
- Patent number 11,132,788
- Issue date Sep 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Shuyang Dou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning optical system and radar
- Patent number 10,989,794
- Issue date Apr 27, 2021
- Konica Minolta, Inc.
- Ryouta Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Image evaluation method and image evaluation device
- Patent number 10,937,146
- Issue date Mar 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor evaluation device and computer program
- Patent number 10,718,611
- Issue date Jul 21, 2020
- HITACHI HIGH-TECH CORPORATION
- Asuka Honda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 10,445,875
- Issue date Oct 15, 2019
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning optical system and radar
- Patent number 10,078,132
- Issue date Sep 18, 2018
- Konica Minolta, Inc.
- Ryouta Ishikawa
- G02 - OPTICS
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 9,990,708
- Issue date Jun 5, 2018
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Illumination device and projector
- Patent number 9,869,856
- Issue date Jan 16, 2018
- Seiko Epson Corporation
- Nozomu Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern inspecting and measuring device and program
- Patent number 9,858,659
- Issue date Jan 2, 2018
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern sensing device and semiconductor sensing system
- Patent number 9,846,931
- Issue date Dec 19, 2017
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Gas sensor, NOx sensor and method of manufacturing gas sensor
- Patent number 9,816,958
- Issue date Nov 14, 2017
- NGK Insulators, Ltd.
- Hiroki Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manufacturing organic electroluminescent e...
- Patent number 9,755,191
- Issue date Sep 5, 2017
- Konica Minolta, Inc.
- Kuniaki Uezawa
- G02 - OPTICS
Information Patent Grant
Pattern shape evaluation device and method
- Patent number 9,679,371
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki Shindo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for forming pattern of organic electroluminescent element
- Patent number 9,570,685
- Issue date Feb 14, 2017
- Konica Minolta, Inc.
- Masahiro Morikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement method, image processing device, and charged particle b...
- Patent number 9,536,170
- Issue date Jan 3, 2017
- Hitachi High-Technologies Corporation
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device and computer program
- Patent number 9,165,214
- Issue date Oct 20, 2015
- Hitachi High-Technologies Corporation
- Yuichi Abe
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 8,959,461
- Issue date Feb 17, 2015
- Hitachi High-Technologies Corporation
- Takuma Shibahara
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measuring apparatus, and pattern measuring method and program
- Patent number 8,942,464
- Issue date Jan 27, 2015
- Hitachi High-Technologies Corporation
- Takuma Shibahara
- G01 - MEASURING TESTING
Information Patent Grant
Screen and projection system
- Patent number 8,780,444
- Issue date Jul 15, 2014
- Seiko Epson Corporation
- Osamu Arakawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of cutting out chips for a plurality of sensor elements from...
- Patent number 8,734,938
- Issue date May 27, 2014
- NGK Insulators, Ltd.
- Hiroyuki Shindo
- G01 - MEASURING TESTING
Information Patent Grant
Refelctive front screen
- Patent number 8,654,442
- Issue date Feb 18, 2014
- Seiko Epson Corporation
- Tatsuo Uchida
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for manufacturing sensor element for gas sensor
- Patent number 8,646,306
- Issue date Feb 11, 2014
- NGK Insulators, Ltd.
- Hiroyuki Shindo
- G01 - MEASURING TESTING
Information Patent Grant
System and method of image processing, and scanning electron micros...
- Patent number 8,515,153
- Issue date Aug 20, 2013
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE INSPECTION EQUIPMENT AND IMAGE PROCESSING METHOD
- Publication number 20250061559
- Publication date Feb 20, 2025
- Hitachi High-Tech Corporation
- Kosuke FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Processing Program, Image Processing Device, and Image Proces...
- Publication number 20240404043
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Masanori OUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20230402249
- Publication date Dec 14, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING METHOD, PATTERN INSPECTION METHOD, IMAGE PROCESSIN...
- Publication number 20230222764
- Publication date Jul 13, 2023
- HITACHI HIGH-TECH CORPORATION
- Masanori OUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Inspection/Measurement Device, and Pattern Inspection/Measu...
- Publication number 20230194253
- Publication date Jun 22, 2023
- Hitachi High-Tech Corporation
- Ryugo KAGETANI
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection System and Defect Inspection Method
- Publication number 20230077332
- Publication date Mar 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuko SANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNING PROCESSING DEVICE AND LEARNING PROCESSING METHOD
- Publication number 20230004811
- Publication date Jan 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Masayoshi ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND MEASUREMENT APPARATUS
- Publication number 20220414833
- Publication date Dec 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Kosuke FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20220335594
- Publication date Oct 20, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasushi EBIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...
- Publication number 20220036116
- Publication date Feb 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Shinichi SHINODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION SYSTEM
- Publication number 20210383524
- Publication date Dec 9, 2021
- Hitachi High-Technologies Corporation
- Shuyang DOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE RECOGNITION DEVICE AND METHOD
- Publication number 20210374403
- Publication date Dec 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryou YUMIBA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Height Information Correction System and Pattern Height Inf...
- Publication number 20210080485
- Publication date Mar 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...
- Publication number 20200134355
- Publication date Apr 30, 2020
- Hitachi High-Technologies Corporation
- Shinichi SHINODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION SYSTEM
- Publication number 20200074611
- Publication date Mar 5, 2020
- Hitachi High-Technologies Corporation
- Shuyang DOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Evaluation Apparatus and Computer Program
- Publication number 20200033122
- Publication date Jan 30, 2020
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING
Information Patent Application
Image Evaluation Method and Image Evaluation Device
- Publication number 20190228522
- Publication date Jul 25, 2019
- Hitachi High-Technologies Corporation
- Shinichi SHINODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning Optical System And Radar
- Publication number 20190056481
- Publication date Feb 21, 2019
- Konica Minolta, Inc.
- Ryouta ISHIKAWA
- G02 - OPTICS
Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20180247400
- Publication date Aug 30, 2018
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERNING APPARATUS AND ORGANIC ELECTROLUMINESCENT ELEMENT PATTERN...
- Publication number 20180108875
- Publication date Apr 19, 2018
- Konica Minolta, Inc.
- Naohiro OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Shape Evaluation Device and Method
- Publication number 20160189368
- Publication date Jun 30, 2016
- Hitachi High-Technologies Corporation
- Hiroyuki SHINDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ILLUMINATION DEVICE AND PROJECTOR
- Publication number 20160170199
- Publication date Jun 16, 2016
- SEIKO EPSON CORPORATION
- Nozomu INOUE
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR MANUFACTURING ORGANIC ELECTROLUMINESCENT E...
- Publication number 20160164046
- Publication date Jun 9, 2016
- Konica Minolta, Inc.
- Kuniaki Uezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING PATTERN OF ORGANIC ELECTROLUMINESCENT ELEMENT
- Publication number 20160087211
- Publication date Mar 24, 2016
- Konica Minolta, Inc.
- Masahiro Morikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Optical System And Radar
- Publication number 20160047902
- Publication date Feb 18, 2016
- Konica Minolta, Inc.
- Ryouta ISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20160005157
- Publication date Jan 7, 2016
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING
Information Patent Application
Pattern Inspecting and Measuring Device and Program
- Publication number 20150228063
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT METHOD, IMAGE PROCESSING DEVICE, AND CHARGED PARTICLE B...
- Publication number 20150110406
- Publication date Apr 23, 2015
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Sensing Device and Semiconductor Sensing System
- Publication number 20150016709
- Publication date Jan 15, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Evaluation Device and Computer Program
- Publication number 20150012243
- Publication date Jan 8, 2015
- Hitachi High-Technologies Corporation
- Asuka Honda
- G01 - MEASURING TESTING

Hiroyuki Shindo

Person

Patents Grantslast 30 patents

Defect inspection with images of different synthesis ratios

Inspection apparatus and measurement apparatus

Image recognition device and method

Image processing system and computer program for performing image p...

Pattern inspection system

Pattern height information correction system and pattern height inf...

Image processing system and computer program for performing image p...

Pattern inspection system

Scanning optical system and radar

Image evaluation method and image evaluation device

Semiconductor evaluation device and computer program

Pattern-measuring apparatus and semiconductor-measuring system

Scanning optical system and radar

Pattern-measuring apparatus and semiconductor-measuring system

Illumination device and projector

Pattern inspecting and measuring device and program

Pattern sensing device and semiconductor sensing system

Gas sensor, NOx sensor and method of manufacturing gas sensor

Method and apparatus for manufacturing organic electroluminescent e...

Pattern shape evaluation device and method

Method for forming pattern of organic electroluminescent element

Measurement method, image processing device, and charged particle b...

Image processing device and computer program

Pattern measurement device and pattern measurement method

Pattern measuring apparatus, and pattern measuring method and program

Screen and projection system

Method of cutting out chips for a plurality of sensor elements from...

Refelctive front screen

Method for manufacturing sensor element for gas sensor

System and method of image processing, and scanning electron micros...

Patents Applicationslast 30 patents

IMAGE INSPECTION EQUIPMENT AND IMAGE PROCESSING METHOD

Image Processing Program, Image Processing Device, and Image Proces...

DEFECT INSPECTION APPARATUS

IMAGE PROCESSING METHOD, PATTERN INSPECTION METHOD, IMAGE PROCESSIN...

Pattern Inspection/Measurement Device, and Pattern Inspection/Measu...

Defect Inspection System and Defect Inspection Method

LEARNING PROCESSING DEVICE AND LEARNING PROCESSING METHOD

INSPECTION APPARATUS AND MEASUREMENT APPARATUS

Defect Inspection Apparatus and Defect Inspection Method

IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...

PATTERN INSPECTION SYSTEM

IMAGE RECOGNITION DEVICE AND METHOD

Pattern Height Information Correction System and Pattern Height Inf...

IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...

PATTERN INSPECTION SYSTEM

Pattern Evaluation Apparatus and Computer Program

Image Evaluation Method and Image Evaluation Device

Scanning Optical System And Radar

Pattern-Measuring Apparatus and Semiconductor-Measuring System

PATTERNING APPARATUS AND ORGANIC ELECTROLUMINESCENT ELEMENT PATTERN...

Pattern Shape Evaluation Device and Method

ILLUMINATION DEVICE AND PROJECTOR

METHOD AND APPARATUS FOR MANUFACTURING ORGANIC ELECTROLUMINESCENT E...

METHOD FOR FORMING PATTERN OF ORGANIC ELECTROLUMINESCENT ELEMENT

Scanning Optical System And Radar

Pattern-Measuring Apparatus and Semiconductor-Measuring System

Pattern Inspecting and Measuring Device and Program

MEASUREMENT METHOD, IMAGE PROCESSING DEVICE, AND CHARGED PARTICLE B...

Pattern Sensing Device and Semiconductor Sensing System

Semiconductor Evaluation Device and Computer Program