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Hiroyuki Shiotsuka
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Gunma, JP
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last 30 patents
Information
Patent Grant
Semiconductor device testing apparatus and its calibration method
Patent number
6,417,682
Issue date
Jul 9, 2002
Advantest Corporation
Toshikazu Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
High speed, high current and low power consumption output circuit
Patent number
6,400,193
Issue date
Jun 4, 2002
Advantest Corp.
Hiroyuki Shiotsuka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Leakage current correcting circuit
Patent number
6,242,966
Issue date
Jun 5, 2001
Advantest Corporation
Hiroyuki Shiotsuka
G01 - MEASURING TESTING
Information
Patent Grant
Programmable load circuit
Patent number
5,945,822
Issue date
Aug 31, 1999
Advantest Corporation
Hiroyuki Shiotsuka
G01 - MEASURING TESTING
Information
Patent Grant
Driver circuit for semiconductor test system
Patent number
5,781,059
Issue date
Jul 14, 1998
Advantest Corp.
Hiroyuki Shiotsuka
G01 - MEASURING TESTING