Hiroyuki SINDO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern-measuring device and computer program
- Patent number 10,180,317
- Issue date Jan 15, 2019
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation condition setting method of semiconductor device, and ev...
- Patent number 9,947,088
- Issue date Apr 17, 2018
- Hitachi High-Technologies Corporation
- Hiroyuki Sindo
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Evaluation Condition Setting Method of Semiconductor Device, and Ev...
- Publication number 20170032212
- Publication date Feb 2, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki SINDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern-Measuring Device and Computer Program
- Publication number 20160356598
- Publication date Dec 8, 2016
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING