Hiroyuki Sumiya

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Ohmiyamachi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Secondary-ion mass spectrometry apparatus using field limiting method
- Patent number 5,278,407
- Issue date Jan 11, 1994
- Hitachi, Ltd.
- Yoshinori Ikebe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for neutralizing an accumulated charge on a sp...
- Patent number 4,992,661
- Issue date Feb 12, 1991
- Hitachi, Ltd.
- Hifumi Tamura
- B82 - NANO-TECHNOLOGY