Hiroyuki Takagi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Support method for metal material, prediction model generation meth...
- Patent number 12,248,742
- Issue date Mar 11, 2025
- JFE Steel Corporation
- Kazuhiro Nakatsuji
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 10,317,368
- Issue date Jun 11, 2019
- Hitachi, Ltd.
- Hisashi Endou
- G01 - MEASURING TESTING
Information Patent Grant
Image photography method, image photography play method, spatial li...
- Patent number 10,108,147
- Issue date Oct 23, 2018
- National University Corporation Toyohashi University of Technology
- Mitsuteru Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray energy spectrum measurement method, X-ray energy spectrum mea...
- Patent number 9,488,741
- Issue date Nov 8, 2016
- Hitachi, Ltd.
- Hiroyuki Takagi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection device and inspection method
- Patent number 9,410,929
- Issue date Aug 9, 2016
- Hitachi, Ltd.
- Hisashi Endo
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexer/demultiplexer and multiplexing/demultiplexing method
- Patent number 8,929,734
- Issue date Jan 6, 2015
- NEC Corporation
- Kenji Mizutani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Node, a monitoring management method used for a node, and a transfe...
- Patent number 8,897,308
- Issue date Nov 25, 2014
- NEC Corporation
- Zhenlong Cui
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Congestion detecting method and communication node
- Patent number 8,737,238
- Issue date May 27, 2014
- NEC Corporation
- Masaki Umayabashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Quality measuring system, quality measuring apparatus, quality meas...
- Patent number 8,693,338
- Issue date Apr 8, 2014
- NEC Corporation
- Ryuichi Ikematsu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Computed tomography system
- Patent number 7,177,388
- Issue date Feb 13, 2007
- Hitachi, Ltd.
- Hiroyuki Takagi
- G01 - MEASURING TESTING
Information Patent Grant
Method for decarbonating waste gas and decarbonating apparatus
- Patent number 6,500,236
- Issue date Dec 31, 2002
- The Tokyo Electric Power Company, Incorporated
- Minoru Suzuki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Brake control apparatus with auxiliary power source means
- Patent number 6,311,801
- Issue date Nov 6, 2001
- Hiroyuki Takagi
- B66 - HOISTING LIFTING HAULING
Information Patent Grant
Moveable control panel for elevators
- Patent number 6,230,845
- Issue date May 15, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Shigeki Yamakawa
- B66 - HOISTING LIFTING HAULING
Information Patent Grant
Method of controlling information in multimedia system
- Patent number 5,481,664
- Issue date Jan 2, 1996
- Hitachi, Ltd.
- Masaaki Hiroya
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FLUOROSCOPIC IMAGE CAPTURING APPARATUS
- Publication number 20240151659
- Publication date May 9, 2024
- Hitachi, Ltd
- Hiroyuki TAKAGI
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, PARTICLE SIZE DISTRI...
- Publication number 20230184656
- Publication date Jun 15, 2023
- Hitachi, Ltd
- Hiroyuki TAKAGI
- G01 - MEASURING TESTING
Information Patent Application
DESIGN SUPPORT METHOD FOR METAL MATERIAL, PREDICTION MODEL GENERATI...
- Publication number 20220100932
- Publication date Mar 31, 2022
- JFE STEEL CORPORATION
- Kazuhiro NAKATSUJI
- B22 - CASTING POWDER METALLURGY
Information Patent Application
DESIGN AID METHOD AND DESIGN AID DEVICE FOR METALLIC MATERIAL
- Publication number 20220083700
- Publication date Mar 17, 2022
- JFE STEEL CORPORATION
- Hiroyuki TAKAGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20170328864
- Publication date Nov 16, 2017
- Hitachi, Ltd
- Hisashi ENDOU
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ENERGY SPECTRUM MEASUREMENT METHOD, X-RAY ENERGY SPECTRUM MEA...
- Publication number 20150301202
- Publication date Oct 22, 2015
- Hitachi, Ltd
- Hiroyuki TAKAGI
- G01 - MEASURING TESTING
Information Patent Application
Image Photography Method, Image Photography Play Method, Spatial Li...
- Publication number 20140253986
- Publication date Sep 11, 2014
- National University Corporation Toyohashi University of Technology
- Mitsuteru Inoue
- G02 - OPTICS
Information Patent Application
Inspection Device and Inspection Method
- Publication number 20140225606
- Publication date Aug 14, 2014
- Hitachi, Ltd
- Hisashi ENDO
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLEXER/DEMULTIPLEXER AND MULTIPLEXING/DEMULTIPLEXING METHOD
- Publication number 20130094853
- Publication date Apr 18, 2013
- NEC Corporation
- Kenji Mizutani
- G02 - OPTICS
Information Patent Application
NODE, A MONITORING MANAGEMENT METHOD USED FOR IT, AND A TRANSFER SY...
- Publication number 20120219003
- Publication date Aug 30, 2012
- NEC Corporation
- Zhenlong Cui
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CONGESTION DETECTING METHOD AND COMMUNICATION NODE
- Publication number 20120113820
- Publication date May 10, 2012
- NEC Corporation
- Masaki Umayabashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
QUALITY MEASURING SYSTEM, QUALITY MEASURING APPARATUS, QUALITY MEAS...
- Publication number 20100220612
- Publication date Sep 2, 2010
- Ryuichi Ikematsu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Computed tomography system
- Publication number 20060133565
- Publication date Jun 22, 2006
- Hiroyuki Takagi
- G01 - MEASURING TESTING
Information Patent Application
Method for decarbonating waste gas and decarbonating apparatus
- Publication number 20010009124
- Publication date Jul 26, 2001
- Minoru Suzuki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Hiroyuki Takagi

Person

Patents Grantslast 30 patents

Support method for metal material, prediction model generation meth...

Defect inspection device and defect inspection method

Image photography method, image photography play method, spatial li...

X-ray energy spectrum measurement method, X-ray energy spectrum mea...

Inspection device and inspection method

Multiplexer/demultiplexer and multiplexing/demultiplexing method

Node, a monitoring management method used for a node, and a transfe...

Congestion detecting method and communication node

Quality measuring system, quality measuring apparatus, quality meas...

Computed tomography system

Method for decarbonating waste gas and decarbonating apparatus

Brake control apparatus with auxiliary power source means

Moveable control panel for elevators

Method of controlling information in multimedia system

Patents Applicationslast 30 patents

FLUOROSCOPIC IMAGE CAPTURING APPARATUS

PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, PARTICLE SIZE DISTRI...

DESIGN SUPPORT METHOD FOR METAL MATERIAL, PREDICTION MODEL GENERATI...

DESIGN AID METHOD AND DESIGN AID DEVICE FOR METALLIC MATERIAL

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

X-RAY ENERGY SPECTRUM MEASUREMENT METHOD, X-RAY ENERGY SPECTRUM MEA...

Image Photography Method, Image Photography Play Method, Spatial Li...

Inspection Device and Inspection Method

MULTIPLEXER/DEMULTIPLEXER AND MULTIPLEXING/DEMULTIPLEXING METHOD

NODE, A MONITORING MANAGEMENT METHOD USED FOR IT, AND A TRANSFER SY...

CONGESTION DETECTING METHOD AND COMMUNICATION NODE

QUALITY MEASURING SYSTEM, QUALITY MEASURING APPARATUS, QUALITY MEAS...

Computed tomography system

Method for decarbonating waste gas and decarbonating apparatus