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Hiroyuki Tanizaki
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Mie, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring device, measuring method, and semiconductor storage device
Patent number
11,646,211
Issue date
May 9, 2023
Kioxia Corporation
Hiroyuki Tanizaki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection system and method for inspecting line width and/or posit...
Patent number
9,406,117
Issue date
Aug 2, 2016
NuFlare Technology, Inc.
Takanao Touya
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and method for inspecting line width and/or posit...
Patent number
9,036,896
Issue date
May 19, 2015
Nuflare Technology, Inc.
Takanao Touya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern inspection device and method of inspecting pattern
Patent number
8,358,340
Issue date
Jan 22, 2013
Kabushiki Kaisha Toshiba
Ryoji Yoshikawa
G01 - MEASURING TESTING
Information
Patent Grant
Unevenness inspection method, method for manufacturing display pane...
Patent number
8,320,658
Issue date
Nov 27, 2012
Kabushiki Kaisha Toshiba
Hiroyuki Tanizaki
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20230324317
Publication date
Oct 12, 2023
KIOXIA Corporation
Takahiro IKEDA
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
Publication number
20230251582
Publication date
Aug 10, 2023
KIOXIA Corporation
Kentaro KASA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Publication number
20230024986
Publication date
Jan 26, 2023
KIOXIA Corporation
Takaki HASHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
MODELING METHOD
Publication number
20220302102
Publication date
Sep 22, 2022
KIOXIA Corporation
Shimpei MIURA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING DEVICE, MEASURING METHOD, AND SEMICONDUCTOR STORAGE DEVICE
Publication number
20220068678
Publication date
Mar 3, 2022
KIOXIA Corporation
Hiroyuki TANIZAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FOCUS CORRECTION METHOD, FOCUS CORRECTION APPARATUS AND NON-TRANSIT...
Publication number
20160041479
Publication date
Feb 11, 2016
KABUSHIKI KAISHA TOSHIBA
Hiroyuki TANIZAKI
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...
Publication number
20150193918
Publication date
Jul 9, 2015
NuFlare Technology, Inc.
Takanao Touya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...
Publication number
20110255770
Publication date
Oct 20, 2011
Kabushiki Kaisha Toshiba
Takanao Touya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PATTERN INSPECTION DEVICE AND METHOD OF INSPECTING PATTERN
Publication number
20090303323
Publication date
Dec 10, 2009
Ryoji Yoshikawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
UNEVENNESS INSPECTION METHOD, METHOD FOR MANUFACTURING DISPLAY PANE...
Publication number
20080063254
Publication date
Mar 13, 2008
Kabushiki Kaisha Toshiba
Hiroyuki Tanizaki
G06 - COMPUTING CALCULATING COUNTING