Hiroyuki TOKUSAKI

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Kasugai-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact voltage measurement device
- Patent number 10,215,779
- Issue date Feb 26, 2019
- Omron Corporation
- Hiroshi Imai
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact voltage measurement device
- Patent number 10,145,865
- Issue date Dec 4, 2018
- Omron Corporation
- Hiroshi Imai
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 9,945,887
- Issue date Apr 17, 2018
- Omron Corporation
- Hiroyuki Tokusaki
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and mounting unit
- Patent number 9,915,689
- Issue date Mar 13, 2018
- Omron Corporation
- Keiki Matsuura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DESIGN ASSIST DEVICE AND DESIGN ASSIST PROGRAM
- Publication number 20240104281
- Publication date Mar 28, 2024
- Omron Corporation
- Liangyu SHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-CONTACT VOLTAGE MEASUREMENT DEVICE
- Publication number 20170067939
- Publication date Mar 9, 2017
- Omron Corporation
- Hiroshi IMAI
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT VOLTAGE MEASUREMENT DEVICE
- Publication number 20170059619
- Publication date Mar 2, 2017
- Omron Corporation
- Hiroshi IMAI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20160025778
- Publication date Jan 28, 2016
- Omron Corporation
- Hiroyuki Tokusaki
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND MOUNTING UNIT
- Publication number 20160018448
- Publication date Jan 21, 2016
- Omron Corporation
- Keiki Matsuura
- G01 - MEASURING TESTING