Hiroyuki USHIBA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Exposure condition evaluation device
- Patent number 10,558,127
- Issue date Feb 11, 2020
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern evaluation device and visual inspection device comprising p...
- Patent number 10,223,784
- Issue date Mar 5, 2019
- Hitachi High-Technologies Corporation
- Hiroyuki Ushiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measurement condition setting device and pattern measuring...
- Patent number 10,190,875
- Issue date Jan 29, 2019
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Auto driving control system
- Patent number 10,176,720
- Issue date Jan 8, 2019
- Hitachi, Ltd.
- Hiroyuki Ushiba
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Matching process device, matching process method, and inspection de...
- Patent number 9,619,727
- Issue date Apr 11, 2017
- Hitachi High-Technologies Corporation
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern matching method, image processing device, and computer program
- Patent number 9,141,879
- Issue date Sep 22, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Ushiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Exposure Condition Evaluation Device
- Publication number 20170336717
- Publication date Nov 23, 2017
- Hitachi High-Technologies Corporation
- Shinichi SHINODA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AUTO DRIVING CONTROL SYSTEM
- Publication number 20170270798
- Publication date Sep 21, 2017
- Hitachi, Ltd
- Hiroyuki USHIBA
- B60 - VEHICLES IN GENERAL
Information Patent Application
PATTERN MEASUREMENT CONDITION SETTING DEVICE AND PATTERN MEASURING...
- Publication number 20170160082
- Publication date Jun 8, 2017
- Hitachi High-Technologies Corporation
- Shinichi SHINODA
- G01 - MEASURING TESTING
Information Patent Application
Pattern Evaluation Device and Visual Inspection Device Comprising P...
- Publication number 20160063690
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Hiroyuki USHIBA
- G01 - MEASURING TESTING
Information Patent Application
Matching Process Device, Matching Process Method, and Inspection De...
- Publication number 20150199583
- Publication date Jul 16, 2015
- Hitachi High-Technologies Corporation
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MATCHING METHOD, IMAGE PROCESSING DEVICE, AND COMPUTER PROGRAM
- Publication number 20130216141
- Publication date Aug 22, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Ushiba
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING TEMPLATE FOR PATTERNMATCHING, AND IMAGE PROCESS...
- Publication number 20130170757
- Publication date Jul 4, 2013
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING

Hiroyuki USHIBA

Person

Patents Grantslast 30 patents

Exposure condition evaluation device

Pattern evaluation device and visual inspection device comprising p...

Pattern measurement condition setting device and pattern measuring...

Auto driving control system

Matching process device, matching process method, and inspection de...

Pattern matching method, image processing device, and computer program

Patents Applicationslast 30 patents

Exposure Condition Evaluation Device

AUTO DRIVING CONTROL SYSTEM

PATTERN MEASUREMENT CONDITION SETTING DEVICE AND PATTERN MEASURING...

Pattern Evaluation Device and Visual Inspection Device Comprising P...

Matching Process Device, Matching Process Method, and Inspection De...

PATTERN MATCHING METHOD, IMAGE PROCESSING DEVICE, AND COMPUTER PROGRAM

METHOD FOR CREATING TEMPLATE FOR PATTERNMATCHING, AND IMAGE PROCESS...