Hiroyuki YAMASHITA

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Blade vibration monitoring device, blade vibration monitoring syste...
- Patent number 12,092,511
- Issue date Sep 17, 2024
- Mitsubishi Heavy Industries, Ltd.
- Hiroyuki Yamashita
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Grant
Apparatus and method for inspecting pattern defect
- Patent number 9,182,359
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Hisashi Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,611,640
- Issue date Dec 17, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Examining apparatus and examining method
- Patent number 8,593,625
- Issue date Nov 26, 2013
- Hitachi High-Technologies Corporation
- Kazumasa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,525,984
- Issue date Sep 3, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 8,422,009
- Issue date Apr 16, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus
- Patent number 8,395,766
- Issue date Mar 12, 2013
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,351,683
- Issue date Jan 8, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 7,999,932
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 7,986,405
- Issue date Jul 26, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,953,567
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus
- Patent number 7,898,653
- Issue date Mar 1, 2011
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 7,733,473
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 7,719,671
- Issue date May 18, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,672,799
- Issue date Mar 2, 2010
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
BLADE VIBRATION MONITORING DEVICE, BLADE VIBRATION MONITORING SYSTE...
- Publication number 20210131861
- Publication date May 6, 2021
- MITSUBISHI HITACHI POWER SYSTEMS, LTD.
- Hiroyuki YAMASHITA
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
Inspection Apparatus
- Publication number 20150355105
- Publication date Dec 10, 2015
- Hitachi High-Technologies Coporation
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING PATTERN DEFECT
- Publication number 20120268742
- Publication date Oct 25, 2012
- Hisashi Hatano
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120224173
- Publication date Sep 6, 2012
- Hitachi High-Technologies Corporation
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
EXAMINING APPARATUS AND EXAMINING METHOD
- Publication number 20110304848
- Publication date Dec 15, 2011
- Kazumasa Tanaka
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20110285989
- Publication date Nov 24, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...
- Publication number 20110267605
- Publication date Nov 3, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION APPARATUS
- Publication number 20110109901
- Publication date May 12, 2011
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20100208251
- Publication date Aug 19, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...
- Publication number 20100195095
- Publication date Aug 5, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20100106443
- Publication date Apr 29, 2010
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20090161943
- Publication date Jun 25, 2009
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20080239319
- Publication date Oct 2, 2008
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection apparatus
- Publication number 20080151234
- Publication date Jun 26, 2008
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20080059094
- Publication date Mar 6, 2008
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Foreign matter inspection method and foreign matter inspection appa...
- Publication number 20070201019
- Publication date Aug 30, 2007
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING

Hiroyuki YAMASHITA

Person

Patents Grantslast 30 patents

Blade vibration monitoring device, blade vibration monitoring syste...

Apparatus and method for inspecting pattern defect

Inspection apparatus and inspection method

Examining apparatus and examining method

Inspection apparatus and inspection method

Foreign matter inspection method and foreign matter inspection appa...

Foreign matter inspection apparatus

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Foreign matter inspection method and foreign matter inspection appa...

Defect inspection apparatus and defect inspection method

Foreign matter inspection apparatus

Inspection apparatus and inspection method

Foreign matter inspection method and foreign matter inspection appa...

Defect inspection apparatus and defect inspection method

Patents Applicationslast 30 patents

BLADE VIBRATION MONITORING DEVICE, BLADE VIBRATION MONITORING SYSTE...

Inspection Apparatus

APPARATUS AND METHOD FOR INSPECTING PATTERN DEFECT

INSPECTION APPARATUS AND INSPECTION METHOD

EXAMINING APPARATUS AND EXAMINING METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...

FOREIGN MATTER INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...

Defect Inspection Apparatus and Defect Inspection Method

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

Foreign matter inspection apparatus

Defect Inspection Apparatus and Defect Inspection Method

Foreign matter inspection method and foreign matter inspection appa...