Hiroyuki Yoshioka

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Burn-in system, burn-in control technique, and semiconductor device...
- Patent number 6,462,574
- Issue date Oct 8, 2002
- Fujitsu Limited
- Hitoshi Izuru
- G01 - MEASURING TESTING
Information Patent Grant
Contact film used for devices having ball grid array structure and...
- Patent number 6,380,492
- Issue date Apr 30, 2002
- Fujitsu Limited
- Hiroyuki Yoshioka
- G01 - MEASURING TESTING