Hisaaki Kanai

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,366,538
- Issue date Jul 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,313,566
- Issue date May 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
High-sensitivity sensor system, detection circuit, and detection me...
- Patent number 10,634,697
- Issue date Apr 28, 2020
- Hitachi, Ltd.
- Wen Li
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,458,924
- Issue date Oct 29, 2019
- Hitachi High-Technologies Corporation
- Hisaaki Kanai
- G01 - MEASURING TESTING
Information Patent Grant
Weak signal detection system and electron microscope equipped with...
- Patent number 9,576,769
- Issue date Feb 21, 2017
- Hitachi, Ltd.
- Hisaaki Kanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image generation method
- Patent number 9,478,392
- Issue date Oct 25, 2016
- Hitachi High-Technologies Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectroscope and its adjusting method
- Patent number 8,563,925
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Hisaaki Kanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustment method, circuit, receiver circuit and transmission equip...
- Patent number 7,965,765
- Issue date Jun 21, 2011
- Hitachi, Ltd.
- Hisaaki Kanai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor circuit, and computing device and communications devi...
- Patent number 7,902,860
- Issue date Mar 8, 2011
- Hitachi, Ltd.
- Keiichi Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Output buffer circuit, differential output buffer circuit, output b...
- Patent number 7,772,877
- Issue date Aug 10, 2010
- Hitachi, Ltd.
- Norio Chujo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Level conversion circuit
- Patent number 7,649,381
- Issue date Jan 19, 2010
- Hitachi, Ltd.
- Hiroki Yamashita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Optical modulation device
- Patent number 6,856,709
- Issue date Feb 15, 2005
- OpNext Japan, Inc.
- Kouichi Uesaka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE
- Publication number 20250224342
- Publication date Jul 10, 2025
- Hitachi High-Tech Corporation
- Tomoharu NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE AMPLIFIER
- Publication number 20240223134
- Publication date Jul 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryohei KUDO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
OPTICAL FOREIGN MATTER INSPECTION DEVICE
- Publication number 20240044806
- Publication date Feb 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hisaaki KANAI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20230175978
- Publication date Jun 8, 2023
- Hitachi High-Tech Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20220291140
- Publication date Sep 15, 2022
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20190178813
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Hisaaki KANAI
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SENSITIVITY SENSOR SYSTEM, DETECTION CIRCUIT, AND DETECTION ME...
- Publication number 20170254831
- Publication date Sep 7, 2017
- Hitachi, Ltd
- Wen LI
- G01 - MEASURING TESTING
Information Patent Application
Weak Signal Detection System and Electron Microscope Equipped with...
- Publication number 20160211110
- Publication date Jul 21, 2016
- Hitachi, Ltd
- Hisaaki KANAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND IMAGE GENERATION METHOD
- Publication number 20160064182
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Minute Signal Detection Method and System
- Publication number 20150012249
- Publication date Jan 8, 2015
- HITACHI LTD.
- Wen Li
- G01 - MEASURING TESTING
Information Patent Application
Mass Spectroscope and its Adjusting Method
- Publication number 20130200256
- Publication date Aug 8, 2013
- Hitachi High-Technologies Corporation
- Hisaaki Kanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OUTPUT BUFFER CIRCUIT, DIFFERENTIAL OUTPUT BUFFER CIRCUIT, OUTPUT B...
- Publication number 20090179666
- Publication date Jul 16, 2009
- Norio Chujo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Semiconductor Circuit, and Computing Device and Communications Devi...
- Publication number 20090085688
- Publication date Apr 2, 2009
- Keiichi YAMAMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Oscillation Circuit
- Publication number 20090033431
- Publication date Feb 5, 2009
- Hitachi, Ltd.
- Hiroki Yamashita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Level conversion circuit
- Publication number 20080157816
- Publication date Jul 3, 2008
- Hitachi, Ltd.
- Hiroki Yamashita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ADJUSTMENT METHOD, CIRCUIT, RECEIVER CIRCUIT AND TRANSMISSION EQUIP...
- Publication number 20080159460
- Publication date Jul 3, 2008
- Hisaaki Kanai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Circuit board provided with digging depth detection structure and t...
- Publication number 20070184687
- Publication date Aug 9, 2007
- Hisaaki Kanai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Optical transmission device
- Publication number 20030091258
- Publication date May 15, 2003
- OpNext Japan, Inc.
- Kouichi Uesaka
- G02 - OPTICS

Hisaaki Kanai

Person

Patents Grantslast 30 patents

Defect inspection apparatus and defect inspection method

Defect inspection device and defect inspection method

High-sensitivity sensor system, detection circuit, and detection me...

Inspection apparatus and inspection method

Weak signal detection system and electron microscope equipped with...

Charged particle beam apparatus and image generation method

Mass spectroscope and its adjusting method

Adjustment method, circuit, receiver circuit and transmission equip...

Semiconductor circuit, and computing device and communications devi...

Output buffer circuit, differential output buffer circuit, output b...

Level conversion circuit

Optical modulation device

Patents Applicationslast 30 patents

OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE

HIGH VOLTAGE AMPLIFIER

OPTICAL FOREIGN MATTER INSPECTION DEVICE

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

HIGH-SENSITIVITY SENSOR SYSTEM, DETECTION CIRCUIT, AND DETECTION ME...

Weak Signal Detection System and Electron Microscope Equipped with...

CHARGED PARTICLE BEAM APPARATUS AND IMAGE GENERATION METHOD

Minute Signal Detection Method and System

Mass Spectroscope and its Adjusting Method

OUTPUT BUFFER CIRCUIT, DIFFERENTIAL OUTPUT BUFFER CIRCUIT, OUTPUT B...

Semiconductor Circuit, and Computing Device and Communications Devi...

Oscillation Circuit

Level conversion circuit

ADJUSTMENT METHOD, CIRCUIT, RECEIVER CIRCUIT AND TRANSMISSION EQUIP...

Circuit board provided with digging depth detection structure and t...

Optical transmission device