Hisaaki Maiwa

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test handler for semiconductor device
- Patent number 6,593,761
- Issue date Jul 15, 2003
- Kabushiki Kaisha Toshiba
- Yoshihito Fukasawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 4,399,520
- Issue date Aug 16, 1983
- Tokyo Shibaura Denki Kabushiki Kaisha
- Shoji Ariizumi
- G11 - INFORMATION STORAGE