Membership
Tour
Register
Log in
Hisae Shibuya
Follow
Person
Chigasaki, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Optical condition determination system and optical condition determ...
Patent number
11,378,521
Issue date
Jul 5, 2022
Hitachi, Ltd.
Hiroaki Kasai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Information processing apparatus, diagnosis method, and program
Patent number
10,977,568
Issue date
Apr 13, 2021
Hitachi Power Solutions Co., Ltd.
Hisae Shibuya
G05 - CONTROLLING REGULATING
Information
Patent Grant
Anomaly detecting method, and apparatus for the same
Patent number
9,940,184
Issue date
Apr 10, 2018
Hitachi High-Technologies Corporation
Hisae Shibuya
G05 - CONTROLLING REGULATING
Information
Patent Grant
Health management system, fault diagnosis system, health management...
Patent number
9,933,338
Issue date
Apr 3, 2018
Hitachi Power Solutions Co., Ltd.
Toujirou Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Anomaly diagnosis method and apparatus
Patent number
9,779,495
Issue date
Oct 3, 2017
Hitachi, Ltd.
Hisae Shibuya
G05 - CONTROLLING REGULATING
Information
Patent Grant
Facility state monitoring method and device for same
Patent number
9,659,250
Issue date
May 23, 2017
Hitachi Power Solutions Co., Ltd.
Hisae Shibuya
G05 - CONTROLLING REGULATING
Information
Patent Grant
Anomaly detection and diagnosis/prognosis method, anomaly detection...
Patent number
9,483,049
Issue date
Nov 1, 2016
Hitachi, Ltd.
Shunji Maeda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Anomaly diagnosis system and anomaly diagnosis method
Patent number
9,465,387
Issue date
Oct 11, 2016
Hitachi Power Solutions Co., Ltd.
Toujirou Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method and apparatus for inspecting patterns formed on a substrate
Patent number
8,824,774
Issue date
Sep 2, 2014
Hitachi High-Technologies Corporation
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for monitoring the state of a facility
Patent number
8,682,824
Issue date
Mar 25, 2014
Hitachi, Ltd.
Hisae Shibuya
G05 - CONTROLLING REGULATING
Information
Patent Grant
Defect classification method and apparatus, and defect inspection a...
Patent number
8,660,340
Issue date
Feb 25, 2014
Hitachi High-Technologies Corporation
Hisae Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting method and inspecting apparatus for substrate surface
Patent number
8,654,350
Issue date
Feb 18, 2014
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus of inspecting defect in semiconductor and method of the same
Patent number
8,643,834
Issue date
Feb 4, 2014
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Error detection method and its system for early detection of errors...
Patent number
8,630,962
Issue date
Jan 14, 2014
Hitachi, Ltd.
Shunji Maeda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Visual inspection method and apparatus and image analysis system
Patent number
8,620,061
Issue date
Dec 31, 2013
Hitachi High-Technologies Corporation
Hisae Shibuya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for inspecting patterns formed on a substrate
Patent number
8,467,594
Issue date
Jun 18, 2013
Hitachi High-Technologies Corporation
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect classification method and apparatus, and defect inspection a...
Patent number
8,437,534
Issue date
May 7, 2013
Hitachi High-Technologies Corporation
Hisae Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and its method
Patent number
8,355,123
Issue date
Jan 15, 2013
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus of inspecting defect in semiconductor and method of the same
Patent number
8,310,666
Issue date
Nov 13, 2012
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting method and inspecting apparatus for substrate surface
Patent number
8,310,665
Issue date
Nov 13, 2012
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting pattern defects
Patent number
8,306,312
Issue date
Nov 6, 2012
Hitachi High-Technologies Corporation
Hisae Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and its method
Patent number
8,149,396
Issue date
Apr 3, 2012
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting method and inspecting apparatus for substrate surface
Patent number
8,144,337
Issue date
Mar 27, 2012
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Visual inspection method and apparatus and image analysis system
Patent number
8,139,841
Issue date
Mar 20, 2012
Hitachi High-Technologies Corporation
Hisae Shibuya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for analyzing defect data and a review system
Patent number
8,116,556
Issue date
Feb 14, 2012
Hitachi High-Technologies Corporation
Hisae Shibuya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for analyzing defect data and inspection apparatus and revie...
Patent number
8,086,422
Issue date
Dec 27, 2011
Hitachi, Ltd.
Hisae Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Method for analyzing defect data and inspection apparatus and revie...
Patent number
8,027,527
Issue date
Sep 27, 2011
Hitachi, Ltd.
Hisae Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus of inspecting defect in semiconductor and method of the same
Patent number
7,952,699
Issue date
May 31, 2011
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and its method
Patent number
7,940,385
Issue date
May 10, 2011
Hitachi High-Technologies Corporation
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting pattern defects
Patent number
7,912,276
Issue date
Mar 22, 2011
Hitachi High-Technologies Corporation
Hisae Shibuya
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Refrigerant Quantity Diagnosis Device, Refrigerant System, and Refr...
Publication number
20230304713
Publication date
Sep 28, 2023
HITACHI GLOBAL LIFE SOLUTIONS, INC.
Yoko KOKUGAN
B60 - VEHICLES IN GENERAL
Information
Patent Application
OPTICAL CONDITION DETERMINATION SYSTEM AND OPTICAL CONDITION DETERM...
Publication number
20210072162
Publication date
Mar 11, 2021
Hitachi, Ltd
Hiroaki Kasai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Anomaly Diagnosis System and Anomaly Diagnosis Method
Publication number
20160202693
Publication date
Jul 14, 2016
Hitachi Power Solutions Co., Ltd.
Toujirou NODA
G05 - CONTROLLING REGULATING
Information
Patent Application
Anomaly Diagnosis Method and Apparatus
Publication number
20150363925
Publication date
Dec 17, 2015
Hitachi, Ltd
Hisae SHIBUYA
G01 - MEASURING TESTING
Information
Patent Application
Information Processing Apparatus, Diagnosis Method, and Program
Publication number
20150220847
Publication date
Aug 6, 2015
Hitachi Power Solutions Co., Ltd.
Hisae SHIBUYA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FACILITY STATUS MONITORING METHOD AND FACILITY STATUS MONITORING DE...
Publication number
20150213706
Publication date
Jul 30, 2015
Hitachi, Ltd
Jie Bai
G08 - SIGNALLING
Information
Patent Application
ANOMALY DETECTING METHOD, AND APPARATUS FOR THE SAME
Publication number
20150169393
Publication date
Jun 18, 2015
Hitachi High-Technologies Corporation
Hisae SHIBUYA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HEALTH MANAGEMENT SYSTEM, FAULT DIAGNOSIS SYSTEM, HEALTH MANAGEMENT...
Publication number
20150160098
Publication date
Jun 11, 2015
Hitachi Power Solutions Co., Ltd.
Toujirou NODA
G01 - MEASURING TESTING
Information
Patent Application
Facility State Monitoring Method and Device for Same
Publication number
20140279795
Publication date
Sep 18, 2014
Hitachi Power Solutions Co., Ltd.
Hisae Shibuya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Anomaly Detection/Diagnostic Method and Anomaly Detection/Diagnosti...
Publication number
20140195184
Publication date
Jul 10, 2014
Hitachi, Ltd
Shunji Maeda
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MONITORING EQUIPMENT CONDITIONS
Publication number
20140039834
Publication date
Feb 6, 2014
Hitachi Power Solutions Co., Ltd.
Hisae SHIBUYA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERNS FORMED ON A SUBSTRATE
Publication number
20130307963
Publication date
Nov 21, 2013
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Anomaly Sensing and Diagnosis Method, Anomaly Sensing and Diagnosis...
Publication number
20130282336
Publication date
Oct 24, 2013
Hitachi, Ltd
Shunji Maeda
G05 - CONTROLLING REGULATING
Information
Patent Application
DEFECT CLASSIFICATION METHOD AND APPARATUS, AND DEFECT INSPECTION A...
Publication number
20130202189
Publication date
Aug 8, 2013
Hitachi High-Technologies Corporation
Hisae Shibuya
G01 - MEASURING TESTING
Information
Patent Application
Malfunction Detection Method and System Thereof
Publication number
20130173218
Publication date
Jul 4, 2013
HITACHI, LTD.
Shunji Maeda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inspecting Method and Inspecting Apparatus For Substrate Surface
Publication number
20130107247
Publication date
May 2, 2013
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANOMALY DETECTION/DIAGNOSIS, SYSTEM FOR ANOMALY DETECTIO...
Publication number
20130073260
Publication date
Mar 21, 2013
Shunji Maeda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS OF INSPECTING DEFECT IN SEMICONDUCTOR AND METHOD OF THE SAME
Publication number
20130038862
Publication date
Feb 14, 2013
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Application
ANOMALY DETECTION METHOD AND ANOMALY DETECTION SYSTEM
Publication number
20120316835
Publication date
Dec 13, 2012
Shunji Maeda
G01 - MEASURING TESTING
Information
Patent Application
FAILURE DIAGNOSIS SYSTEM, FAILURE DIAGNOSIS DEVICE AND FAILURE DIAG...
Publication number
20120290497
Publication date
Nov 15, 2012
Hitachi, Ltd
Hiroyuki Magara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR MONITORING THE STATE OF A FACILITY
Publication number
20120290879
Publication date
Nov 15, 2012
Hisae Shibuya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EQUIPMENT STATUS MONITORING METHOD, MONITORING SYSTEM, AND MONITORI...
Publication number
20120271587
Publication date
Oct 25, 2012
Hitachi, Ltd
Hisae Shibuya
G05 - CONTROLLING REGULATING
Information
Patent Application
Anomaly Detection and Diagnosis/Prognosis Method, Anomaly Detection...
Publication number
20120166142
Publication date
Jun 28, 2012
Hitachi, Ltd
Shunji Maeda
G05 - CONTROLLING REGULATING
Information
Patent Application
Inspecting Method and Inspecting Apparatus for Substrate Surface
Publication number
20120162665
Publication date
Jun 28, 2012
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Application
Visual Inspection Method And Apparatus And Image Analysis System
Publication number
20120155741
Publication date
Jun 21, 2012
Hisae Shibuya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND ITS METHOD
Publication number
20120133927
Publication date
May 31, 2012
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Application
Anomaly Detection Method and Anomaly Detection System
Publication number
20120041575
Publication date
Feb 16, 2012
Hitachi, Ltd
Shunji Maeda
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERNS FORMED ON A SUBSTRATE
Publication number
20120002860
Publication date
Jan 5, 2012
Kaoru Sakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS OF INSPECTING DEFECT IN SEMICONDUCTOR AND METHOD OF THE SAME
Publication number
20110228262
Publication date
Sep 22, 2011
Akira Hamamatsu
G01 - MEASURING TESTING
Information
Patent Application
Defect Inspection Apparatus and Its Method
Publication number
20110205534
Publication date
Aug 25, 2011
Akira Hamamatsu
G01 - MEASURING TESTING