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Hisae Yamamura
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Konan 3-2-3, Konan-ku, Yokohama-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Method monitoring a quality of electronic circuits and its manufact...
Patent number
6,622,054
Issue date
Sep 16, 2003
Hitachi, Ltd.
Hirohito Okuda
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Grant
Defect judgement processing method and apparatus
Patent number
6,333,992
Issue date
Dec 25, 2001
Hitachi, Ltd.
Hisae Yamamura
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for automatic focusing and a method and appara...
Patent number
5,780,866
Issue date
Jul 14, 1998
Hitachi, Ltd.
Hisae Yamamura
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring the size of a circuit or wiring...
Patent number
5,459,794
Issue date
Oct 17, 1995
Takanori Ninomiya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor memory device having redundancy memory cells for repl...
Patent number
5,373,471
Issue date
Dec 13, 1994
Hitachi, Ltd.
Makoto Saeki
G11 - INFORMATION STORAGE