Hisafumi IMURA

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring/inspecting apparatus and measuring/inspecting method enab...
- Patent number 8,890,096
- Issue date Nov 18, 2014
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEASURING/INSPECTING APPARATUS AND MEASURING/INSPECTING METHOD
- Publication number 20140008534
- Publication date Jan 9, 2014
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS