Hisafumi Iwata

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection system
- Patent number 8,804,109
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method, inspecting system, and method for manufacturing...
- Patent number 8,428,336
- Issue date Apr 23, 2013
- Hitachi, Ltd.
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection system
- Patent number 8,319,960
- Issue date Nov 27, 2012
- Hitachi High-Technologies Corporation
- Kenji Aiko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect inspection system
- Patent number 7,733,474
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Kenji Aiko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting defects
- Patent number 7,426,023
- Issue date Sep 16, 2008
- Hitachi, Ltd.
- Yoshimasa Ohshima
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method, inspecting system, and method for manufacturing...
- Patent number 7,068,834
- Issue date Jun 27, 2006
- Hitachi, Ltd.
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection condition setting program, inspection device and inspect...
- Patent number 6,928,375
- Issue date Aug 9, 2005
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analysis program, defect inspection apparatus, defe...
- Patent number 6,826,735
- Issue date Nov 30, 2004
- Hitachi, Ltd.
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and semiconductor device manufacturing method
- Patent number 6,775,817
- Issue date Aug 10, 2004
- Hitachi, Ltd.
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, inspection apparatus, inspection program, and pr...
- Patent number 6,687,633
- Issue date Feb 3, 2004
- Hitachi, Ltd.
- Makoto Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system and method for manufacturing electronic devices u...
- Patent number 6,611,728
- Issue date Aug 26, 2003
- Hitachi, Ltd.
- Natsuyo Morioka
- G01 - MEASURING TESTING
Information Patent Grant
Electric device inspection method and electric device inspection sy...
- Patent number 6,539,272
- Issue date Mar 25, 2003
- Hitachi, Ltd.
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Grant
Pattern detecting method, pattern detecting apparatus, projection e...
- Patent number 5,684,565
- Issue date Nov 4, 1997
- Hitachi, Ltd.
- Yoshitada Oshida
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for the inspection of defects
- Patent number 5,293,538
- Issue date Mar 8, 1994
- Hitachi, Ltd.
- Hisafumi Iwata
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing thin film multilayer substrate, and method and...
- Patent number 5,278,012
- Issue date Jan 11, 1994
- Hitachi, Ltd.
- Chie Yamanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method of aligning and bonding tab inner leads
- Patent number 5,059,559
- Issue date Oct 22, 1991
- Hitachi, Ltd.
- Michio Takahashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION SYSTEM
- Publication number 20130182100
- Publication date Jul 18, 2013
- Hitachi High-Technologies Corporation
- Kenji AIKO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM
- Publication number 20100271473
- Publication date Oct 28, 2010
- Hitachi High-Technologies Corporation
- Kenji AIKO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Defect inspection system
- Publication number 20080291436
- Publication date Nov 27, 2008
- Kenji Aiko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Inspecting method, inspecting system, and method for manufacturing...
- Publication number 20060274932
- Publication date Dec 7, 2006
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for detecting defects
- Publication number 20060139629
- Publication date Jun 29, 2006
- Yoshimasa Ohshima
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting defects
- Publication number 20050264797
- Publication date Dec 1, 2005
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
Inspection condition setting program, inspection device and inspect...
- Publication number 20050195396
- Publication date Sep 8, 2005
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Application
Inspection condition setting program, inspection device and inspect...
- Publication number 20030195712
- Publication date Oct 16, 2003
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analysis program, defect inspection apparatus, defe...
- Publication number 20030058436
- Publication date Mar 27, 2003
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Application
Inspection system, inspection apparatus, inspection program, and pr...
- Publication number 20020143483
- Publication date Oct 3, 2002
- Hitachi, Ltd.
- Makoto Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection system and semiconductor device manufacturing method
- Publication number 20020052053
- Publication date May 2, 2002
- Makoto Ono
- G01 - MEASURING TESTING

Hisafumi Iwata

Person

Patents Grantslast 30 patents

Defect inspection system

Inspecting method, inspecting system, and method for manufacturing...

Defect inspection system

Defect inspection system

Method and apparatus for detecting defects

Inspecting method, inspecting system, and method for manufacturing...

Inspection condition setting program, inspection device and inspect...

Inspection data analysis program, defect inspection apparatus, defe...

Inspection system and semiconductor device manufacturing method

Inspection system, inspection apparatus, inspection program, and pr...

Inspection system and method for manufacturing electronic devices u...

Electric device inspection method and electric device inspection sy...

Pattern detecting method, pattern detecting apparatus, projection e...

Method and apparatus for the inspection of defects

Method for producing thin film multilayer substrate, and method and...

Method of aligning and bonding tab inner leads

Patents Applicationslast 30 patents

DEFECT INSPECTION SYSTEM

DEFECT INSPECTION SYSTEM

Defect inspection system

Inspecting method, inspecting system, and method for manufacturing...

Method and apparatus for detecting defects

Method and apparatus for detecting defects

Inspection condition setting program, inspection device and inspect...

Inspection condition setting program, inspection device and inspect...

Inspection data analysis program, defect inspection apparatus, defe...

Inspection system, inspection apparatus, inspection program, and pr...

Inspection system and semiconductor device manufacturing method