Hisakazu Yoshino

Person

Tochigi-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface inspection apparatus
- Patent number 6,104,481
- Issue date Aug 15, 2000
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting slight defects on a photomask pattern
- Patent number 6,100,970
- Issue date Aug 8, 2000
- Kabushiki Kaisha Topcon
- Hisakazu Yoshino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical substrate inspection apparatus
- Patent number 6,084,716
- Issue date Jul 4, 2000
- Kabushiki Kaisha Toshiba
- Yasushi Sanada
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sample inspection apparatus and sample inspection method
- Patent number 5,828,457
- Issue date Oct 27, 1998
- Kabushiki Kaisha Toshiba
- Mitsuo Tabata
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting slight defects in a photomask p...
- Patent number 5,812,259
- Issue date Sep 22, 1998
- Kabushiki Kaisha Topcon
- Hisakazu Yoshino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning projection optical device
- Patent number 5,673,135
- Issue date Sep 30, 1997
- Kabushiki Kaisha Topcon
- Hisakazu Yoshino
- G02 - OPTICS
Information Patent Grant
Wide-field exposure optical system
- Patent number 5,448,416
- Issue date Sep 5, 1995
- Kabushiki Kaisha Topcon
- Toshiki Okumura
- G02 - OPTICS
Information Patent Grant
Scanning type projector
- Patent number 5,369,521
- Issue date Nov 29, 1994
- Kabushiki Kaisha Topcon
- Hisakazu Yoshino
- G02 - OPTICS
Information Patent Grant
Method of producing a lens
- Patent number 5,298,096
- Issue date Mar 29, 1994
- Kabushiki Kaisha Topcon
- Hisakazu Yoshino
- G02 - OPTICS
Information Patent Grant
Method and an apparatus for aligning first and second objects with...
- Patent number 4,984,890
- Issue date Jan 15, 1991
- Kabushiki Kaisha Toshiba
- Toru Tojo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and an apparatus for aligning first and second objects with...
- Patent number 4,902,133
- Issue date Feb 20, 1990
- Kabushiki Kaisha Toshiba
- Toru Tojo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and device for aligning first and second objects relative to...
- Patent number 4,808,002
- Issue date Feb 28, 1989
- Kabushiki Kaisha Toshiba
- Toru Tojo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Slit lamp and accessory device thereof
- Patent number 4,711,541
- Issue date Dec 8, 1987
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Hisakazu Yoshino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Eye disease inspecting instrument
- Patent number 4,711,540
- Issue date Dec 8, 1987
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Hisakazu Yoshino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Stereo-microscope with two observation optical systems each includi...
- Patent number 4,702,570
- Issue date Oct 27, 1987
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Hisakazu Yoshino
- G02 - OPTICS
Information Patent Grant
Method for determining refractive index of an object
- Patent number 4,632,528
- Issue date Dec 30, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Hisakazu Yoshino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Stereo-microscope with a common objective lens system
- Patent number 4,601,550
- Issue date Jul 22, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Hisakazu Yoshino
- G02 - OPTICS
Information Patent Grant
Specular microscope
- Patent number 4,597,650
- Issue date Jul 1, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Hisakazu Yoshino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Lens judging apparatus of lens meter
- Patent number 4,571,842
- Issue date Feb 25, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Yukio Ikezawa
- G01 - MEASURING TESTING
Information Patent Grant
Projection type lensmeter
- Patent number 4,564,291
- Issue date Jan 14, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Hisakazu Yoshino
- G01 - MEASURING TESTING

Hisakazu Yoshino

Person

Patents Grantslast 30 patents

Surface inspection apparatus

Apparatus for inspecting slight defects on a photomask pattern

Optical substrate inspection apparatus

Sample inspection apparatus and sample inspection method

Method and apparatus for inspecting slight defects in a photomask p...

Scanning projection optical device

Wide-field exposure optical system

Scanning type projector

Method of producing a lens

Method and an apparatus for aligning first and second objects with...

Method and an apparatus for aligning first and second objects with...

Method and device for aligning first and second objects relative to...

Slit lamp and accessory device thereof

Eye disease inspecting instrument

Stereo-microscope with two observation optical systems each includi...

Method for determining refractive index of an object

Stereo-microscope with a common objective lens system

Specular microscope

Lens judging apparatus of lens meter

Projection type lensmeter