Hisaki Ishida

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Nirasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature measuring apparatus
- Patent number 8,608,378
- Issue date Dec 17, 2013
- Tokyo Electron Limited
- Hisaki Ishida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE MEASURING APPARATUS
- Publication number 20120269229
- Publication date Oct 25, 2012
- TOKYO ELECTRON LIMITED
- Hisaki Ishida
- G01 - MEASURING TESTING
Information Patent Application
WAFER-TYPE TEMPERATURE SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20110233546
- Publication date Sep 29, 2011
- TOKYO ELECTRON LIMITED
- Koudai Higashi
- G01 - MEASURING TESTING