Hisaki Kozaki

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Yokkaichi-Shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor substrate, substrate inspection method, semiconductor...
- Patent number 7,973,281
- Issue date Jul 5, 2011
- Kabushiki Kaisha Toshiba
- Hiroyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate, substrate inspection method, semiconductor...
- Patent number 7,573,066
- Issue date Aug 11, 2009
- Kabushiki Kaisha Toshiba
- Hiroyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor substrate, substrate inspection method, semiconductor...
- Publication number 20090272901
- Publication date Nov 5, 2009
- Kabushiki Kaisha Toshiba
- Hiroyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor substrate, substrate inspection method, semiconductor...
- Publication number 20080011947
- Publication date Jan 17, 2008
- Hiroyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS