Hisako Aoyama

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for filtering chemical
- Patent number 8,097,169
- Issue date Jan 17, 2012
- Kabushiki Kaisha Toshiba
- Yoshihisa Kawamura
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting defects which originate from chemical solution...
- Patent number 7,862,965
- Issue date Jan 4, 2011
- Kabushiki Kaisha Toshiba
- Hisako Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Method of selecting pattern to be measured, pattern inspection meth...
- Patent number 7,075,098
- Issue date Jul 11, 2006
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Mask pattern correction method
- Patent number 6,060,368
- Issue date May 9, 2000
- Kabushiki Kaisha Toshiba
- Koji Hashimoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method of selecting pattern to be measured, pattern inspection meth...
- Publication number 20040155208
- Publication date Aug 12, 2004
- Takahiro Ikeda
- G01 - MEASURING TESTING