Hisako Kamiyanagi

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Toyama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Elemental analysis method and semiconductor device manufacturing me...
- Patent number 8,088,632
- Issue date Jan 3, 2012
- Panasonic Corporation
- Satoshi Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resin film evaluation method and method for manufacturing a semicon...
- Patent number 7,880,141
- Issue date Feb 1, 2011
- Panasonic Corporation
- Hisako Kamiyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating electronic device
- Patent number 7,319,061
- Issue date Jan 15, 2008
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating electronic device
- Patent number 7,282,416
- Issue date Oct 16, 2007
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELEMENTAL ANALYSIS METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING ME...
- Publication number 20100003770
- Publication date Jan 7, 2010
- Satoshi SHIBATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resin film evaluation method and method for manufacturing a semicon...
- Publication number 20080128616
- Publication date Jun 5, 2008
- Hisako Kamiyanagi
- G01 - MEASURING TESTING
Information Patent Application
Method for fabricating electronic device
- Publication number 20070048918
- Publication date Mar 1, 2007
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating electronic device
- Publication number 20060079044
- Publication date Apr 13, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Satoshi Shibata
- H01 - BASIC ELECTRIC ELEMENTS