Hisamitsu Endoh

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Shiga, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and combined illumination lens
- Patent number 7,601,957
- Issue date Oct 13, 2009
- National University Corporation Kyoto Institute of Technology
- Hisamitsu Endoh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Fresnel zone plate and x-ray microscope using the fresnel zone plate
- Publication number 20090052619
- Publication date Feb 26, 2009
- Hisamitsu Endoh
- G02 - OPTICS
Information Patent Application
Electron Microscope and Combined Illumination Lens
- Publication number 20080149833
- Publication date Jun 26, 2008
- Hisamitsu Endoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY