Hisanao Akima

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged-particle-beam device and method for correcting aberration
- Patent number 9,484,182
- Issue date Nov 1, 2016
- Hitachi High-Technologies Corporation
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,312,094
- Issue date Apr 12, 2016
- Hitachi High-Technologies Corporation
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical equipment and method for measuring lens ab...
- Patent number 9,224,574
- Issue date Dec 29, 2015
- Hitachi High-Technologies Corporation
- Takaho Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission type electron microscope
- Patent number 8,866,078
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE-BEAM DEVICE AND METHOD FOR CORRECTING ABERRATION
- Publication number 20150235801
- Publication date Aug 20, 2015
- Hitachi High-Technologies Corporation
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20140231666
- Publication date Aug 21, 2014
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL EQUIPMENT AND METHOD FOR MEASURING LENS AB...
- Publication number 20130256531
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Takaho Yoshida
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TRANSMISSION TYPE ELECTRON MICROSCOPE
- Publication number 20130099117
- Publication date Apr 25, 2013
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS