Hisanori Yokura

Person

Nagoya, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Physical quantity sensor
- Patent number 11,054,326
- Issue date Jul 6, 2021
- Denso Corporation
- Yutaka Hayakawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device capable of suppressing cracks of through-hole...
- Patent number 10,468,322
- Issue date Nov 5, 2019
- Denso Corporation
- Kazuyuki Kakuta
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 9,944,515
- Issue date Apr 17, 2018
- Denso Corporation
- Yutaka Hayakawa
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Dynamic quantity sensor
- Patent number 9,835,507
- Issue date Dec 5, 2017
- Denso Corporation
- Takahiro Kawano
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 9,664,768
- Issue date May 30, 2017
- Denso Corporation
- Takamoto Furuichi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor device producing method
- Patent number 9,349,644
- Issue date May 24, 2016
- Denso Corporation
- Takashi Katsumata
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor physical quantity sensor and method for manufacturing...
- Patent number 9,105,753
- Issue date Aug 11, 2015
- Denso Corporation
- Masaya Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor with a plurality of heater portions to fix the dire...
- Patent number 9,024,632
- Issue date May 5, 2015
- Denso Corporation
- Takamoto Furuichi
- G01 - MEASURING TESTING
Information Patent Grant
Method of making semiconductor device
- Patent number 8,785,231
- Issue date Jul 22, 2014
- Denso Corporation
- Kazuhiko Sugiura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device
- Patent number 8,497,557
- Issue date Jul 30, 2013
- Denso Corporation
- Masaya Tanaka
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor dynamic quantity sensor and method of manufacturing t...
- Patent number 8,413,507
- Issue date Apr 9, 2013
- Denso Corporation
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 8,169,082
- Issue date May 1, 2012
- Denso Corporation
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor dynamic quantity sensor and method of producing the same
- Patent number 8,106,471
- Issue date Jan 31, 2012
- Denso Corporation
- Hisanori Yokura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 8,089,144
- Issue date Jan 3, 2012
- Denso Corporation
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Physical quantity sensor and method for manufacturing the same
- Patent number 7,821,085
- Issue date Oct 26, 2010
- Denso Corporation
- Shigenori Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor sensor for measuring a physical quantity and method o...
- Patent number 7,644,623
- Issue date Jan 12, 2010
- Denso Corporation
- Hisanori Yokura
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive type humidity sensor
- Patent number 7,387,024
- Issue date Jun 17, 2008
- Denso Corporation
- Toshikazu Itakura
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of membrane characteristics in semiconductor device wit...
- Patent number 7,157,781
- Issue date Jan 2, 2007
- Denso Corporation
- Eishi Kawasaki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Fabri-Perot filter
- Patent number 7,154,094
- Issue date Dec 26, 2006
- Denso Corporation
- Hisanori Yokura
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for detecting capacitance change in variable capacitance
- Patent number 7,071,709
- Issue date Jul 4, 2006
- Denso Corporation
- Toshikazu Itakura
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor device having an oxidation...
- Patent number 6,316,300
- Issue date Nov 13, 2001
- Denso Corporation
- Yoshihiko Ozeki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20200095115
- Publication date Mar 26, 2020
- DENSO CORPORATION
- Takahiro KAWANO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PHYSICAL QUANTITY SENSOR
- Publication number 20190339147
- Publication date Nov 7, 2019
- DENSO CORPORATION
- Yutaka HAYAKAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20190051575
- Publication date Feb 14, 2019
- Denso Corporation
- Kazuyuki KAKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20170305742
- Publication date Oct 26, 2017
- Denso Corporation
- Yutaka HAYAKAWA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DYNAMIC QUANTITY SENSOR
- Publication number 20160187215
- Publication date Jun 30, 2016
- Denso Corporation
- Takahiro KAWANO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE PRODUCING METHOD
- Publication number 20150228540
- Publication date Aug 13, 2015
- DENSO CORPORTION
- Takashi Katsumata
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MAGNETIC SENSOR
- Publication number 20150042319
- Publication date Feb 12, 2015
- Denso Corporation
- Takamoto Furuichi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PHYSICAL QUANTITY SENSOR AND METHOD FOR MANUFACTURING...
- Publication number 20140042497
- Publication date Feb 13, 2014
- DENSO CORPORATION
- Masaya TANAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MAKING SEMICONDUCTOR DEVICE
- Publication number 20130178008
- Publication date Jul 11, 2013
- DENSO CORPORATION
- Kazuhiko Sugiura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MAGNETIC SENSOR AND MANUFACTURING METHOD OF THE SAME
- Publication number 20120306490
- Publication date Dec 6, 2012
- DENSO CORPORATION
- Takamoto FURUICHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20120049381
- Publication date Mar 1, 2012
- DENSO CORPORATION
- Tetsuo FUJII
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor dynamic quantity sensor and method of manufacturing t...
- Publication number 20100307246
- Publication date Dec 9, 2010
- DENSO CORPORATION
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100252898
- Publication date Oct 7, 2010
- DENSO CORPORATION
- Masaya TANAKA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor device and method of making the same
- Publication number 20100155865
- Publication date Jun 24, 2010
- DENSO CORPORATION
- Kazuhiko Sugiura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20100148341
- Publication date Jun 17, 2010
- DENSO CORPORATION
- Tetsuo Fuji
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor dymamic quantity sensor and method of producing the same
- Publication number 20100117167
- Publication date May 13, 2010
- Denso Corporation
- Hisanori Yokura
- G01 - MEASURING TESTING
Information Patent Application
Physical quantity sensor and method for manufacturing the same
- Publication number 20090261430
- Publication date Oct 22, 2009
- DENSO CORPORATION
- Shigenori Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor sensor and method of manufacturing the same
- Publication number 20080202249
- Publication date Aug 28, 2008
- DENSO CORPORATION
- Hisanori Yokura
- G01 - MEASURING TESTING
Information Patent Application
Capacitive type humidity sensor
- Publication number 20050188764
- Publication date Sep 1, 2005
- DENSO Corporation
- Toshikazu Itakura
- G01 - MEASURING TESTING
Information Patent Application
Fabri-perot filter
- Publication number 20050167597
- Publication date Aug 4, 2005
- DENSO Corporation
- Hisanori Yokura
- G02 - OPTICS
Information Patent Application
Infrared gas sensor
- Publication number 20050161605
- Publication date Jul 28, 2005
- DENSO Corporation
- Hisanori Yokura
- G01 - MEASURING TESTING
Information Patent Application
Circuit for detecting capacitance change in variable capacitance
- Publication number 20050099251
- Publication date May 12, 2005
- DENSO Corporation
- Toshikazu Itakura
- G01 - MEASURING TESTING
Information Patent Application
Gas detection device
- Publication number 20040188622
- Publication date Sep 30, 2004
- DENSO CORPORATION NIPPON SOKEN, INC.
- Hisanori Yokura
- G01 - MEASURING TESTING
Information Patent Application
Capacitance type humidity sensor
- Publication number 20040177685
- Publication date Sep 16, 2004
- DENSO Corporation
- Hisanori Yokura
- G01 - MEASURING TESTING
Information Patent Application
Enhancement of membrane characteristics in semiconductor device wit...
- Publication number 20030215974
- Publication date Nov 20, 2003
- Eishi Kawasaki
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Hisanori Yokura

Person

Patents Grantslast 30 patents

Physical quantity sensor

Semiconductor device capable of suppressing cracks of through-hole...

Manufacturing method of semiconductor device

Dynamic quantity sensor

Magnetic sensor

Semiconductor device producing method

Semiconductor physical quantity sensor and method for manufacturing...

Magnetic sensor with a plurality of heater portions to fix the dire...

Method of making semiconductor device

Semiconductor device

Semiconductor dynamic quantity sensor and method of manufacturing t...

Semiconductor device and method for manufacturing the same

Semiconductor dynamic quantity sensor and method of producing the same

Semiconductor device and method for manufacturing the same

Physical quantity sensor and method for manufacturing the same

Semiconductor sensor for measuring a physical quantity and method o...

Capacitive type humidity sensor

Enhancement of membrane characteristics in semiconductor device wit...

Fabri-Perot filter

Circuit for detecting capacitance change in variable capacitance

Method of manufacturing a semiconductor device having an oxidation...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

PHYSICAL QUANTITY SENSOR

SEMICONDUCTOR DEVICE

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

DYNAMIC QUANTITY SENSOR

SEMICONDUCTOR DEVICE PRODUCING METHOD

MAGNETIC SENSOR

SEMICONDUCTOR PHYSICAL QUANTITY SENSOR AND METHOD FOR MANUFACTURING...

METHOD OF MAKING SEMICONDUCTOR DEVICE

MAGNETIC SENSOR AND MANUFACTURING METHOD OF THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

Semiconductor dynamic quantity sensor and method of manufacturing t...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor device and method of making the same

Semiconductor device and method for manufacturing the same

Semiconductor dymamic quantity sensor and method of producing the same

Physical quantity sensor and method for manufacturing the same

Semiconductor sensor and method of manufacturing the same

Capacitive type humidity sensor

Fabri-perot filter

Infrared gas sensor

Circuit for detecting capacitance change in variable capacitance

Gas detection device

Capacitance type humidity sensor

Enhancement of membrane characteristics in semiconductor device wit...