Hisao Hayama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pressing member and electronic device handling apparatus
- Patent number 7,676,908
- Issue date Mar 16, 2010
- Advantest Corporation
- Hisao Hayama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,104,204
- Issue date Aug 15, 2000
- Advantest Corporation
- Hisao Hayama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test handler system for IC tester
- Patent number 5,865,319
- Issue date Feb 2, 1999
- Advantest Corp.
- Hiroshi Okuda
- G01 - MEASURING TESTING
Information Patent Grant
IC test equipment
- Patent number 5,177,435
- Issue date Jan 5, 1993
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
IC test equipment
- Patent number 5,172,049
- Issue date Dec 15, 1992
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Pressing Member and Electronic Device Handling Apparatus
- Publication number 20080048158
- Publication date Feb 28, 2008
- ADVANTEST CORPORATION
- Hisao Hayama
- G01 - MEASURING TESTING