Hisao Igarashi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sheet-like probe, method of producing the probe, and application of...
- Patent number 7,737,707
- Issue date Jun 15, 2010
- JSR Corporation
- Katsumi Sato
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Sheet-like probe, method of producing the probe, and application of...
- Patent number 7,671,609
- Issue date Mar 2, 2010
- JSR Corporation
- Katsumi Sato
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Probe member for wafer inspection, probe card for wafer inspection...
- Patent number 7,656,176
- Issue date Feb 2, 2010
- JSR Corporation
- Mutsuhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus, wafer inspecting apparatus provided with the probe...
- Patent number 7,446,544
- Issue date Nov 4, 2008
- JSR Corporation
- Hisao Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic conductive connector and wafer inspection device
- Patent number 7,384,279
- Issue date Jun 10, 2008
- JSR Corporation
- Hisao Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic conductive connector, conductive paste composition, pro...
- Patent number 7,311,531
- Issue date Dec 25, 2007
- JSR Corporation
- Hisao Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic conductive sheet and wafer inspection device
- Patent number 6,870,385
- Issue date Mar 22, 2005
- JSR Corporation
- Kazuo Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic conductive sheet
- Patent number 6,849,335
- Issue date Feb 1, 2005
- JSR Corporation
- Hisao Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anisotropically conductive sheet and connector
- Patent number 6,604,953
- Issue date Aug 12, 2003
- JSR Corporation
- Hisao Igarashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE MEMBER FOR WAFER INSPECTION, PROBE CARD FOR WAFER INSPECTION...
- Publication number 20090140756
- Publication date Jun 4, 2009
- JSR Corporation
- Mutsuhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Probe Member for Wafer Inspection, Probe Card for Wafer Inspection...
- Publication number 20070268032
- Publication date Nov 22, 2007
- JSR Corporation
- Mutsuhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Sheet-Like Probe, Method Of Producing The Probe, And Application Of...
- Publication number 20070205783
- Publication date Sep 6, 2007
- JSR Corporation
- Katsumi Sato
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
Probe apparatus,wafer inspecting apparatus provided with the probe...
- Publication number 20070178727
- Publication date Aug 2, 2007
- JSR Corporation
- Hisao Igarashi
- G01 - MEASURING TESTING
Information Patent Application
Anisotropic conductive connector, conductive paste composition, pro...
- Publication number 20060211280
- Publication date Sep 21, 2006
- JSR Corporation
- Hisao Igarashi
- G01 - MEASURING TESTING
Information Patent Application
Anisotropic conductive connector and wafer inspection device
- Publication number 20060154500
- Publication date Jul 13, 2006
- JSR Corporation
- Hisao Igarashi
- G01 - MEASURING TESTING
Information Patent Application
Anisotropic conductive sheet and wafer inspection device
- Publication number 20040028893
- Publication date Feb 12, 2004
- Kazuo Inoue
- G01 - MEASURING TESTING
Information Patent Application
Anisotropic conductive sheet
- Publication number 20040009343
- Publication date Jan 15, 2004
- Hisao Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Anisotropically conductive sheet and connector
- Publication number 20010049208
- Publication date Dec 6, 2001
- JSR Corporation
- Hisao Igarashi
- G01 - MEASURING TESTING

Hisao Igarashi

Person

Patents Grantslast 30 patents

Sheet-like probe, method of producing the probe, and application of...

Sheet-like probe, method of producing the probe, and application of...

Probe member for wafer inspection, probe card for wafer inspection...

Probe apparatus, wafer inspecting apparatus provided with the probe...

Anisotropic conductive connector and wafer inspection device

Anisotropic conductive connector, conductive paste composition, pro...

Anisotropic conductive sheet and wafer inspection device

Anisotropic conductive sheet

Anisotropically conductive sheet and connector

Patents Applicationslast 30 patents

PROBE MEMBER FOR WAFER INSPECTION, PROBE CARD FOR WAFER INSPECTION...

Probe Member for Wafer Inspection, Probe Card for Wafer Inspection...

Sheet-Like Probe, Method Of Producing The Probe, And Application Of...

Probe apparatus,wafer inspecting apparatus provided with the probe...

Anisotropic conductive connector, conductive paste composition, pro...

Anisotropic conductive connector and wafer inspection device

Anisotropic conductive sheet and wafer inspection device

Anisotropic conductive sheet

Anisotropically conductive sheet and connector