Hisao Izawa

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of and apparatus for measuring pattern positions
- Patent number 5,539,521
- Issue date Jul 23, 1996
- Nikon Corporation
- Taro Otokake
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of and apparatus for measuring pattern positions
- Patent number 5,459,577
- Issue date Oct 17, 1995
- Nikon Corporation
- Taro Ototake
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Small gap measuring apparatus
- Patent number 4,685,805
- Issue date Aug 11, 1987
- Nippon Kogaku K.K.
- Kenichi Kodama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for aligning mask and wafer used in semiconductor circuit...
- Patent number 4,636,626
- Issue date Jan 13, 1987
- Nippon Kogaku K.K.
- Junji Hazama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask feed method and apparatus for exposure replicate systems
- Patent number 4,598,242
- Issue date Jul 1, 1986
- Nippon Kogaku K.K.
- Yutaka Hayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for the attitude control of plate-form body
- Patent number 4,537,501
- Issue date Aug 27, 1985
- Nippon Kogaku K.K.
- Yukio Kakizaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY