Hisao KOBASHI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and trimming method of the same
- Patent number 12,061,123
- Issue date Aug 13, 2024
- Renesas Electronics Corporation
- Shin Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of diagnosing semiconductor device
- Patent number 10,324,123
- Issue date Jun 18, 2019
- Renesas Electronics Corporation
- Hisao Kobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method of diagnosing semiconductor device
- Patent number 9,829,532
- Issue date Nov 28, 2017
- Renesas Electronics Corporation
- Hisao Kobashi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND TRIMMING METHOD OF THE SAME
- Publication number 20230160754
- Publication date May 25, 2023
- RENESAS ELECTRONICS CORPORATION
- Shin TAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF DIAGNOSING SEMICONDUCTOR DEVICE
- Publication number 20180080976
- Publication date Mar 22, 2018
- RENESAS ELECTRONICS CORPORATION
- Hisao KOBASHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF DIAGNOSING SEMICONDUCTOR DEVICE
- Publication number 20170168109
- Publication date Jun 15, 2017
- RENESAS ELECTRONICS CORPORATION
- Hisao KOBASHI
- G01 - MEASURING TESTING