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Hisao Miyazaki
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Ibaraki, JP
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Patents Grants
last 30 patents
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Patent Grant
Method for determining number of layers of two-dimensional thin fil...
Patent number
8,698,077
Issue date
Apr 15, 2014
NEC Corporation
Hidefumi Hiura
G01 - MEASURING TESTING
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Patent Grant
Electronic device and method for producing electronic device
Patent number
8,043,978
Issue date
Oct 25, 2011
Riken
Hisao Miyazaki
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
METHOD FOR DETERMINING NUMBER OF LAYERS OF TWO-DIMENSIONAL THIN FIL...
Publication number
20130087705
Publication date
Apr 11, 2013
NATIONAL INSTITUTE FOR MATERIALS SCIENCE
Hidefumi Hiura
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR PRODUCING ELECTRONIC DEVICE
Publication number
20090139752
Publication date
Jun 4, 2009
Riken
Hisao Miyazaki
B82 - NANO-TECHNOLOGY