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Hisao Narita

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  • Aomori, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Connecting Apparatus and Light Condensing Substrate
    • Publication number 20220260792
    • Publication date Aug 18, 2022
    • Kabushiki Kaisha Nihon Micronics
    • HIROSHI KAMIYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT SYSTEM
    • Publication number 20220196570
    • Publication date Jun 23, 2022
    • Kabushiki Kaisha Nihon Micronics
    • Michitaka OKUTA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRICAL CONNECTING DEVICE
    • Publication number 20220146553
    • Publication date May 12, 2022
    • Takayuki HAYASHIZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT SYSTEM AND MEASUREMENT METHOD
    • Publication number 20220034714
    • Publication date Feb 3, 2022
    • Kabushiki Kaisha Nihon Micronics
    • Michitaka OKUTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT SYSTEM
    • Publication number 20210148835
    • Publication date May 20, 2021
    • Kabushiki Kaisha Nihon Micronics
    • Michitaka OKUTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL PROBE, OPTICAL PROBE ARRAY, TEST SYSTEM AND TEST METHOD
    • Publication number 20210102864
    • Publication date Apr 8, 2021
    • Kabushiki Kaisha Nihon Micronics
    • Michitaka OKUTA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRICAL CONNECTION APPARATUS
    • Publication number 20200158754
    • Publication date May 21, 2020
    • Kabushiki Kaisha Nihon Micronics
    • Takayuki HAYASHIZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20100210122
    • Publication date Aug 19, 2010
    • Kabushiki Kaisha Nihon Micronics
    • Ken HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20100105224
    • Publication date Apr 29, 2010
    • Kabushiki Kaisha Nihon Micronics
    • Hisao Narita
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD
    • Publication number 20090140760
    • Publication date Jun 4, 2009
    • Kabushiki Kaisha Nihon Micronics
    • Satoshi Narita
    • G01 - MEASURING TESTING