Hisao Takahara

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Particle analyzer system
- Patent number 6,184,517
- Issue date Feb 6, 2001
- Yokogawa Electric Corporation
- Tsuguo Sawada
- G01 - MEASURING TESTING
Information Patent Grant
Particle component analyzing apparatus, and equivalent particle dia...
- Patent number 5,665,964
- Issue date Sep 9, 1997
- Yokogawa Electric Corporation
- Hisao Takahara
- G01 - MEASURING TESTING
Information Patent Grant
Particle component analyzing apparatus, and equivalent particle dia...
- Patent number 5,510,611
- Issue date Apr 23, 1996
- Yokogawa Electric Corporation
- Hisao Takahara
- G01 - MEASURING TESTING