Hisashi Ata

Person

Murphy, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Contactors with signal pins, ground pins, and short ground pins
- Patent number 11,156,638
- Issue date Oct 26, 2021
- Texas Instruments Incorporated
- Kay Chan Tong
- G01 - MEASURING TESTING
Information Patent Grant
Interposers having cuts through an insulating substrate
- Patent number 10,962,571
- Issue date Mar 30, 2021
- Texas Instruments Incorporated
- Thiha Shwe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for depopulating pins from contactor test socke...
- Patent number 10,539,592
- Issue date Jan 21, 2020
- Texas Instruments Incorporated
- Kay Chan Tong
- G01 - MEASURING TESTING
Information Patent Grant
Force biased spring probe pin assembly
- Patent number 10,126,329
- Issue date Nov 13, 2018
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force biased spring probe pin assembly
- Patent number 10,114,038
- Issue date Oct 30, 2018
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force biased spring probe pin assembly
- Patent number 9,755,344
- Issue date Sep 5, 2017
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force biased spring probe pin assembly
- Patent number 9,698,513
- Issue date Jul 4, 2017
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spring biased contact pin assembly
- Patent number 9,673,539
- Issue date Jun 6, 2017
- Texas Instruments Incorporated
- Hisashi Ata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Depopulating Pins from Contactor Test Socke...
- Publication number 20200141974
- Publication date May 7, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- G01 - MEASURING TESTING
Information Patent Application
CONTACTORS WITH SIGNAL PINS, GROUND PINS, AND SHORT GROUND PINS
- Publication number 20190204357
- Publication date Jul 4, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan TONG
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSERS HAVING CUTS THROUGH AN INSULATING SUBSTRATE
- Publication number 20190204359
- Publication date Jul 4, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Thiha SHWE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DEPOPULATING PINS FROM CONTACTOR TEST SOCKE...
- Publication number 20180106835
- Publication date Apr 19, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- G01 - MEASURING TESTING
Information Patent Application
FORCE BIASED SPRING PROBE PIN ASSEMBLY
- Publication number 20170184633
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- G01 - MEASURING TESTING
Information Patent Application
FORCE BIASED SPRING PROBE PIN ASSEMBLY
- Publication number 20170187136
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORCE BIASED SPRING PROBE PIN ASSEMBLY
- Publication number 20170187137
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORCE BIASED SPRING PROBE PIN ASSEMBLY
- Publication number 20170184632
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- G01 - MEASURING TESTING
Information Patent Application
SPRING BIASED CONTACT PIN ASSEMBLY
- Publication number 20170085013
- Publication date Mar 23, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Hisashi Ata
- H01 - BASIC ELECTRIC ELEMENTS

Hisashi Ata

Person

Patents Grantslast 30 patents

Contactors with signal pins, ground pins, and short ground pins

Interposers having cuts through an insulating substrate

Systems and methods for depopulating pins from contactor test socke...

Force biased spring probe pin assembly

Force biased spring probe pin assembly

Force biased spring probe pin assembly

Force biased spring probe pin assembly

Spring biased contact pin assembly

Patents Applicationslast 30 patents

Systems and Methods for Depopulating Pins from Contactor Test Socke...

CONTACTORS WITH SIGNAL PINS, GROUND PINS, AND SHORT GROUND PINS

INTERPOSERS HAVING CUTS THROUGH AN INSULATING SUBSTRATE

SYSTEMS AND METHODS FOR DEPOPULATING PINS FROM CONTACTOR TEST SOCKE...

FORCE BIASED SPRING PROBE PIN ASSEMBLY

FORCE BIASED SPRING PROBE PIN ASSEMBLY

FORCE BIASED SPRING PROBE PIN ASSEMBLY

FORCE BIASED SPRING PROBE PIN ASSEMBLY

SPRING BIASED CONTACT PIN ASSEMBLY