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Hisashi ENDO
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Stress distribution measurement device and stress distribution meas...
Patent number
11,513,013
Issue date
Nov 29, 2022
Hitachi, Ltd.
Masanori Kitaoka
G01 - MEASURING TESTING
Information
Patent Grant
Deterioration diagnosis system
Patent number
9,810,743
Issue date
Nov 7, 2017
Hitachi, Ltd.
Kohji Maki
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and inspection method
Patent number
9,410,929
Issue date
Aug 9, 2016
Hitachi, Ltd.
Hisashi Endo
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current inspection device, eddy current inspection probe, and...
Patent number
9,274,085
Issue date
Mar 1, 2016
Hitachi, Ltd.
Hisashi Endo
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current flaw detection system and eddy current flaw detection...
Patent number
9,222,915
Issue date
Dec 29, 2015
Hitachi - GE Nuclear Energy, Ltd.
Akira Nishimizu
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current testing device
Patent number
8,183,862
Issue date
May 22, 2012
Hitachi, Ltd.
Hisashi Endo
G01 - MEASURING TESTING
Information
Patent Grant
System and method for superimposing an image on another image in a...
Patent number
7,131,907
Issue date
Nov 7, 2006
Kabushiki Kaisha Sega
Toshiaki Miida
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Computer game apparatus
Patent number
6,424,353
Issue date
Jul 23, 2002
Sega Enterprises, Ltd.
Shinichiro Yamamoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and apparatus for photographing medical image
Patent number
4,716,426
Issue date
Dec 29, 1987
Yokogawa Medical Systems, Limited
Hisashi Endo
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Stress Distribution Measurement Device and Stress Distribution Meas...
Publication number
20210063255
Publication date
Mar 4, 2021
Hitachi, Ltd
Masanori KITAOKA
G01 - MEASURING TESTING
Information
Patent Application
Deterioration Diagnosis System
Publication number
20150331051
Publication date
Nov 19, 2015
Hitachi, Ltd
Kohji MAKI
G01 - MEASURING TESTING
Information
Patent Application
Inspection Device and Inspection Method
Publication number
20140225606
Publication date
Aug 14, 2014
Hitachi, Ltd
Hisashi ENDO
G01 - MEASURING TESTING
Information
Patent Application
Eddy Current Inspection Device, Eddy Current Inspection Probe, and...
Publication number
20130241541
Publication date
Sep 19, 2013
Hitachi, Ltd
Hisashi ENDO
G01 - MEASURING TESTING
Information
Patent Application
Eddy Current Flaw Detection System and Eddy Current Flaw Detection...
Publication number
20130193960
Publication date
Aug 1, 2013
Hitachi-GE NUCLEAR ENERGY, LTD.
Akira NISHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
EDDY CURRENT TESTING DEVICE
Publication number
20090230952
Publication date
Sep 17, 2009
Hisashi Endo
G01 - MEASURING TESTING
Information
Patent Application
Image display control method, apparatus thereof, recording media on...
Publication number
20030112233
Publication date
Jun 19, 2003
Toshiaki Miida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Article care seal
Publication number
20020171545
Publication date
Nov 21, 2002
Hisashi Endo
G08 - SIGNALLING
Information
Patent Application
COMPUTER GAME APPARATUS
Publication number
20010026284
Publication date
Oct 4, 2001
SHINICHIRO YAMAMOTO
G06 - COMPUTING CALCULATING COUNTING