Hisashi Fujiwara

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Nirasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Displacement measurement apparatus for microstructure and displceme...
- Patent number 8,141,426
- Issue date Mar 27, 2012
- Tokyo Electron Limited
- Naoki Ikeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive coupling plasma processing apparatus and method
- Patent number 7,692,916
- Issue date Apr 6, 2010
- Tokyo Electron Limited
- Naoki Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic decoder circuit operative at low frequency clock signals wi...
- Patent number 5,442,308
- Issue date Aug 15, 1995
- NEC Corporation
- Hisashi Fujiwara
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Displacement Measurement apparatus for microstructure and displceme...
- Publication number 20090145230
- Publication date Jun 11, 2009
- TOKYO ELECTRON LIMITED
- Naoki Ikeuchi
- G01 - MEASURING TESTING
Information Patent Application
MICROSTRUCTURE INSPECTING APPARATUS, MICROSTRUCTURE INSPECTING METH...
- Publication number 20090095095
- Publication date Apr 16, 2009
- TOKYO ELECTRON LIMITED
- Masato Hayashi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Capacitive coupling plasma processing apparatus and method
- Publication number 20070029194
- Publication date Feb 8, 2007
- Naoki Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Processing apparatus
- Publication number 20050042881
- Publication date Feb 24, 2005
- TOKYO ELECTRON LIMITED
- Shinya Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS