Hisashi Hatano

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 10,861,145
- Issue date Dec 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flaw inspection device and flaw inspection method
- Patent number 10,816,484
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Flaw inspection device and flaw inspection method
- Patent number 10,466,181
- Issue date Nov 5, 2019
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device, display device, and defect classification...
- Patent number 9,964,500
- Issue date May 8, 2018
- Hitachi High-Technologies Corporation
- Hisashi Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 9,933,370
- Issue date Apr 3, 2018
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and device for same
- Patent number 9,488,596
- Issue date Nov 8, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape measuring apparatus
- Patent number 9,310,190
- Issue date Apr 12, 2016
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and device for same
- Patent number 9,255,888
- Issue date Feb 9, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern defect
- Patent number 9,182,359
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Hisashi Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,902,417
- Issue date Dec 2, 2014
- Hitachi High-Technologies Corporation
- Nobuaki Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 8,289,507
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,952,700
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,817,261
- Issue date Oct 19, 2010
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,369,223
- Issue date May 6, 2008
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
- Publication number 20200057003
- Publication date Feb 20, 2020
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20190206047
- Publication date Jul 4, 2019
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
- Publication number 20190094155
- Publication date Mar 28, 2019
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Device, Display Device, and Defect Classification...
- Publication number 20170328846
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Hisashi HATANO
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING APPARATUS
- Publication number 20160178360
- Publication date Jun 23, 2016
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE FOR SAME
- Publication number 20160109382
- Publication date Apr 21, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20150109435
- Publication date Apr 23, 2015
- Hitachi High-Technologies Corporation
- Masaaki ITO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE FOR SAME
- Publication number 20140253912
- Publication date Sep 11, 2014
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING APPARATUS
- Publication number 20140198321
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20130271754
- Publication date Oct 17, 2013
- Hitachi High-Technologies Corporation
- Nobuaki Hirose
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING PATTERN DEFECT
- Publication number 20120268742
- Publication date Oct 25, 2012
- Hisashi Hatano
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN
- Publication number 20110228258
- Publication date Sep 22, 2011
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN
- Publication number 20110032515
- Publication date Feb 10, 2011
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Method Of Apparatus For Detecting Particles On A Specimen
- Publication number 20080204724
- Publication date Aug 28, 2008
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Method of apparatus for detecting particles on a specimen
- Publication number 20050213086
- Publication date Sep 29, 2005
- Akira Hamamatsu
- G01 - MEASURING TESTING

Hisashi Hatano

Person

Patents Grantslast 30 patents

Defect inspection device and defect inspection method

Flaw inspection device and flaw inspection method

Flaw inspection device and flaw inspection method

Defect inspection device, display device, and defect classification...

Inspection apparatus

Defect inspection method and device for same

Surface shape measuring apparatus

Defect inspection method and device for same

Apparatus and method for inspecting pattern defect

Inspection apparatus

Method of apparatus for detecting particles on a specimen

Method of apparatus for detecting particles on a specimen

Method of apparatus for detecting particles on a specimen

Method of apparatus for detecting particles on a specimen

Patents Applicationslast 30 patents

FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD

Defect Inspection Device, Display Device, and Defect Classification...

SURFACE SHAPE MEASURING APPARATUS

DEFECT INSPECTION METHOD AND DEVICE FOR SAME

INSPECTION APPARATUS

DEFECT INSPECTION METHOD AND DEVICE FOR SAME

SURFACE SHAPE MEASURING APPARATUS

INSPECTION APPARATUS

APPARATUS AND METHOD FOR INSPECTING PATTERN DEFECT

METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

Method Of Apparatus For Detecting Particles On A Specimen

Method of apparatus for detecting particles on a specimen