Hisashi Isozaki

Person

Tokyo-to, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature measurement device and temperature measurement method
- Patent number 10,502,630
- Issue date Dec 10, 2019
- Topcon Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Illuminance measuring system
- Patent number 10,067,233
- Issue date Sep 4, 2018
- TOPCON Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Management system for illumination facility
- Patent number 9,952,091
- Issue date Apr 24, 2018
- TOPCON Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Illuminance measuring system
- Patent number 9,823,354
- Issue date Nov 21, 2017
- TOPCON Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Spatial light measuring method and spatial light measuring system
- Patent number 9,719,850
- Issue date Aug 1, 2017
- TOPCON Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope device
- Patent number 8,791,415
- Issue date Jul 29, 2014
- Horiba Ltd.
- Hisashi Isozaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope device
- Patent number 8,692,194
- Issue date Apr 8, 2014
- Horiba Ltd.
- Hisashi Isozaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complex type microscopic device
- Patent number 8,351,115
- Issue date Jan 8, 2013
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G02 - OPTICS
Information Patent Grant
Measuring apparatus
- Patent number 8,243,264
- Issue date Aug 14, 2012
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope device
- Patent number 8,097,849
- Issue date Jan 17, 2012
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G02 - OPTICS
Information Patent Grant
Surface inspecting method and device
- Patent number 8,009,286
- Issue date Aug 30, 2011
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection method and apparatus
- Patent number 7,394,532
- Issue date Jul 1, 2008
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Particle detecting method and storage medium storing program for im...
- Patent number 7,352,461
- Issue date Apr 1, 2008
- Tokyo Electron Limited
- Susumu Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for surface inspection
- Patent number 7,245,388
- Issue date Jul 17, 2007
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection method and surface inspection system
- Patent number 7,064,820
- Issue date Jun 20, 2006
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection system
- Patent number 7,046,353
- Issue date May 16, 2006
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection system
- Patent number 6,941,792
- Issue date Sep 13, 2005
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspecting apparatus and method
- Patent number 6,847,444
- Issue date Jan 25, 2005
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspecting apparatus
- Patent number 6,771,364
- Issue date Aug 3, 2004
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus and method
- Patent number 6,654,111
- Issue date Nov 25, 2003
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspecting apparatus and method
- Patent number 6,611,328
- Issue date Aug 26, 2003
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspecting apparatus and method
- Patent number 6,587,192
- Issue date Jul 1, 2003
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for surface inspection
- Patent number 6,331,888
- Issue date Dec 18, 2001
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for surface inspection
- Patent number 6,204,918
- Issue date Mar 20, 2001
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for surface inspection
- Patent number 6,115,117
- Issue date Sep 5, 2000
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for surface inspection
- Patent number 6,108,078
- Issue date Aug 22, 2000
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 6,104,481
- Issue date Aug 15, 2000
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for defining the location of a foreign object on a rotary...
- Patent number 5,814,828
- Issue date Sep 29, 1998
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20180087968
- Publication date Mar 29, 2018
- TOPCON CORPORATION
- Hisashi ISOZAKI
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
Illuminance Measuring System
- Publication number 20180045829
- Publication date Feb 15, 2018
- TOPCON Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Management System For Illumination Facility
- Publication number 20170023404
- Publication date Jan 26, 2017
- TOPCON Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Spatial Light Measuring Method And Spatial Light Measuring System
- Publication number 20170023403
- Publication date Jan 26, 2017
- TOPCON Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Illuminance Measuring System
- Publication number 20170023351
- Publication date Jan 26, 2017
- TOPCON Corporation
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE MICROSCOPE AND MEASURING APPARATUS
- Publication number 20120120485
- Publication date May 17, 2012
- KABUSHIKI KAISHA TOPCON
- Fumio Ootomo
- G02 - OPTICS
Information Patent Application
Electron Microscope Device
- Publication number 20110315877
- Publication date Dec 29, 2011
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS
- Publication number 20110043808
- Publication date Feb 24, 2011
- Hisashi ISOZAKI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20110043825
- Publication date Feb 24, 2011
- Hisashi ISOZAKI
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope device
- Publication number 20100163729
- Publication date Jul 1, 2010
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope device
- Publication number 20100163728
- Publication date Jul 1, 2010
- Kabushiki Kaisha TOPCON
- Fumio Ohtomo
- G02 - OPTICS
Information Patent Application
Complex type microscopic device
- Publication number 20100091362
- Publication date Apr 15, 2010
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- G02 - OPTICS
Information Patent Application
SURFACE INSPECTING METHOD AND DEVICE
- Publication number 20100007872
- Publication date Jan 14, 2010
- KABUSHIKI KAISHA TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Particle detecting method and storage medium storing program for im...
- Publication number 20060132771
- Publication date Jun 22, 2006
- TOKYO ELECTRON LIMITED
- Susumu Saito
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection method and apparatus
- Publication number 20040130727
- Publication date Jul 8, 2004
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Method and device for surface inspection
- Publication number 20040119971
- Publication date Jun 24, 2004
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Laser light source device and surface inspection apparatus using it
- Publication number 20040095572
- Publication date May 20, 2004
- KABUSHIKI KAISHA TOPCON
- Yoichiro Iwa
- G02 - OPTICS
Information Patent Application
Surface inspecting apparatus and method
- Publication number 20040061851
- Publication date Apr 1, 2004
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspecting apparatus
- Publication number 20040036865
- Publication date Feb 26, 2004
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection method and surface inspection system
- Publication number 20030184744
- Publication date Oct 2, 2003
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection system
- Publication number 20030103203
- Publication date Jun 5, 2003
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection system
- Publication number 20030029220
- Publication date Feb 13, 2003
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspecting apparatus and method
- Publication number 20020021438
- Publication date Feb 21, 2002
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspecting apparatus and method
- Publication number 20020005945
- Publication date Jan 17, 2002
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus and method
- Publication number 20010035951
- Publication date Nov 1, 2001
- Hisashi Isozaki
- G01 - MEASURING TESTING

Hisashi Isozaki

Person

Patents Grantslast 30 patents

Temperature measurement device and temperature measurement method

Illuminance measuring system

Management system for illumination facility

Illuminance measuring system

Spatial light measuring method and spatial light measuring system

Electron microscope device

Electron microscope device

Complex type microscopic device

Measuring apparatus

Electron microscope device

Surface inspecting method and device

Surface inspection method and apparatus

Particle detecting method and storage medium storing program for im...

Method and device for surface inspection

Surface inspection method and surface inspection system

Surface inspection system

Surface inspection system

Surface inspecting apparatus and method

Surface inspecting apparatus

Surface inspection apparatus and method

Surface inspecting apparatus and method

Surface inspecting apparatus and method

Method and apparatus for surface inspection

Apparatus for surface inspection

Method and apparatus for surface inspection

Method and apparatus for surface inspection

Surface inspection apparatus

Apparatus for defining the location of a foreign object on a rotary...

Patents Applicationslast 30 patents

TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD

Illuminance Measuring System

Management System For Illumination Facility

Spatial Light Measuring Method And Spatial Light Measuring System

Illuminance Measuring System

INTERFERENCE MICROSCOPE AND MEASURING APPARATUS

Electron Microscope Device

MEASURING APPARATUS

MEASURING APPARATUS

Electron microscope device

Electron microscope device

Complex type microscopic device

SURFACE INSPECTING METHOD AND DEVICE

Particle detecting method and storage medium storing program for im...

Surface inspection method and apparatus

Method and device for surface inspection

Laser light source device and surface inspection apparatus using it

Surface inspecting apparatus and method

Surface inspecting apparatus

Surface inspection method and surface inspection system

Surface inspection system

Surface inspection system

Surface inspecting apparatus and method

Surface inspecting apparatus and method

Surface inspection apparatus and method