Membership
Tour
Register
Log in
Hisashi Koike
Follow
Person
Yamanashi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Quartz probe apparatus
Patent number
5,091,694
Issue date
Feb 25, 1992
Tokyo Electron Limited
Towl Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Probe apparatus
Patent number
5,086,270
Issue date
Feb 4, 1992
Tokyo Electron Limited
Wataru Karasawa
G01 - MEASURING TESTING
Information
Patent Grant
Electric probing test machine
Patent number
4,950,982
Issue date
Aug 21, 1990
Tokyo Electron Limited
Tadashi Obikane
G01 - MEASURING TESTING
Information
Patent Grant
Transfer apparatus for plate-like member
Patent number
4,941,800
Issue date
Jul 17, 1990
Tokyo Electron Limited
Hisashi Koike
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Carrier for transferring plate-like objects one by one, a handling...
Patent number
4,901,011
Issue date
Feb 13, 1990
Tokyo Electron Limited
Hisashi Koike
G01 - MEASURING TESTING