Hisashi Konaka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffraction apparatus and measurement method
- Patent number 12,313,573
- Issue date May 27, 2025
- Rigaku Corporation
- Hisashi Konaka
- G01 - MEASURING TESTING
Information Patent Grant
Processing method, processing apparatus and processing program conf...
- Patent number 10,876,979
- Issue date Dec 29, 2020
- Rigaku Corporation
- Hisashi Konaka
- G01 - MEASURING TESTING
Information Patent Grant
Structure refining apparatus, method and program
- Patent number 10,296,725
- Issue date May 21, 2019
- Rigaku Corporation
- Hisashi Konaka
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
X-ray diffraction method and X-ray diffraction apparatus
- Patent number 8,340,248
- Issue date Dec 25, 2012
- Rigaku Corporation
- Hideo Toraya
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD
- Publication number 20230258586
- Publication date Aug 17, 2023
- Rigaku Corporation
- Hisashi KONAKA
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD, PROCESSING APPARATUS AND PROCESSING PROGRAM
- Publication number 20170370860
- Publication date Dec 28, 2017
- Rigaku Corporation
- Hisashi KONAKA
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE REFINING APPARATUS, METHOD AND PROGRAM
- Publication number 20150227643
- Publication date Aug 13, 2015
- Rigaku Corporation
- Hisashi KONAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS
- Publication number 20100246768
- Publication date Sep 30, 2010
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING