Hisashi Matsumoto

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Jitter measuring trigger generator, jitter measuring apparatus usin...
- Patent number 8,811,463
- Issue date Aug 19, 2014
- Anritsu Corporation
- Takashi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
SDH test apparatus and SDH test method
- Patent number 6,888,799
- Issue date May 3, 2005
- Anritsu Corporation
- Hisashi Matsumoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
SDH signal generator
- Patent number 6,785,297
- Issue date Aug 31, 2004
- Anritsu Corporation
- Hisashi Matsumoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
JITTER MEASURING TRIGGER GENERATOR, JITTER MEASURING APPARATUS USIN...
- Publication number 20130200923
- Publication date Aug 8, 2013
- Anritsu Corporation
- Takashi Murakami
- G01 - MEASURING TESTING