Hisashi Nakajima

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Yamanashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Swing support apparatus
- Patent number 5,886,488
- Issue date Mar 23, 1999
- Tokyo Electron Limited
- Hisashi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus with tilt correction mechanisms
- Patent number 5,804,983
- Issue date Sep 8, 1998
- Tokyo Electron Limited
- Hisashi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus for correcting the probe card posture before testing
- Patent number 5,642,056
- Issue date Jun 24, 1997
- Tokyo Electron Limited
- Hisashi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and connection method for the testing apparatus
- Patent number 5,594,357
- Issue date Jan 14, 1997
- Tokyo Electron Limited
- Hisashi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Transfer apparatus having an elevator and prober using the same
- Patent number 5,506,512
- Issue date Apr 9, 1996
- Tokyo Electron Limited
- Noboru Tozawa
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and connection method for the testing apparatus
- Patent number 5,489,853
- Issue date Feb 6, 1996
- Tokyo Electron Limited
- Hisashi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for turning over a test head of a wafer probing machine
- Patent number 4,875,005
- Issue date Oct 17, 1989
- Tokyo Electron Limited
- Michimasa Terada
- G01 - MEASURING TESTING