Hisashi Ohtsuka

Person

Kanagawa-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Detecting method and dielectric particles containing magnetic mater...
- Patent number 8,456,158
- Issue date Jun 4, 2013
- FUJIFILM Corporation
- Hisashi Ohtsuka
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Device for mass spectrometry, and mass spectrometry apparatus and m...
- Patent number 8,278,626
- Issue date Oct 2, 2012
- FUJIFILM Corporation
- Naoki Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorescence detecting method
- Patent number 8,106,368
- Issue date Jan 31, 2012
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Immunochromatoassay method and immunochromatoassay kit
- Patent number 8,039,268
- Issue date Oct 18, 2011
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Detection method, detection apparatus, and sample cell and kit for...
- Patent number 8,039,267
- Issue date Oct 18, 2011
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Screening method and apparatus
- Patent number 7,885,769
- Issue date Feb 8, 2011
- FUJIFILM Corporation
- Toshihito Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon enhanced fluorescence sensor and fluorescence detec...
- Patent number 7,738,107
- Issue date Jun 15, 2010
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Sensor unit and assay method of assay in utilizing attenuated total...
- Patent number 7,715,012
- Issue date May 11, 2010
- FUJIFILM Corporation
- Nobuhiko Ogura
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescence sensor
- Patent number 7,701,579
- Issue date Apr 20, 2010
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Sensor unit for assay in utilizing attenuated total reflection
- Patent number 7,682,566
- Issue date Mar 23, 2010
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Base plate for use in mass spectrometry analysis, and method and ap...
- Patent number 7,579,588
- Issue date Aug 25, 2009
- FUJIFILM Corporation
- Masayuki Naya
- G01 - MEASURING TESTING
Information Patent Grant
Sensor unit and assay method of assay in utilizing attenuated total...
- Patent number 7,515,270
- Issue date Apr 7, 2009
- FUJIFILM Corporation
- Nobuhiko Ogura
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring dissociation rate coefficient by surface plasm...
- Patent number 7,439,078
- Issue date Oct 21, 2008
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...
- Patent number 7,418,023
- Issue date Aug 26, 2008
- FUJIFILM Corporation
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring reaction rate coefficient by surface plasmon r...
- Patent number 7,413,911
- Issue date Aug 19, 2008
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...
- Patent number 7,411,990
- Issue date Aug 12, 2008
- FUJIFILM Corporation
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...
- Patent number 7,403,554
- Issue date Jul 22, 2008
- FUJIFILM Corporation
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring method and measuring apparatus utilizing attenuated total...
- Patent number 7,365,853
- Issue date Apr 29, 2008
- FUJIFILM Corporation
- Shu Sato
- G01 - MEASURING TESTING
Information Patent Grant
Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...
- Patent number 7,362,789
- Issue date Apr 22, 2008
- FUJIFILM Corporation
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...
- Patent number 7,356,065
- Issue date Apr 8, 2008
- FUJIFILM Corporation
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement method and apparatus
- Patent number 7,330,263
- Issue date Feb 12, 2008
- FUJIFILM Corporation
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...
- Patent number 7,154,930
- Issue date Dec 26, 2006
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring method and apparatus using attenuation in total internal...
- Patent number 7,102,754
- Issue date Sep 5, 2006
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
LASER-DIODE-EXCITED LASER APPARATUS, FIBER LASER APPARATUS, AND FIB...
- Patent number 6,816,532
- Issue date Nov 9, 2004
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state laser apparatus excited by laser light from semiconduct...
- Patent number 6,795,475
- Issue date Sep 21, 2004
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring method and apparatus using attenuation in total internal...
- Patent number 6,791,691
- Issue date Sep 14, 2004
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-laser-pumped solid state laser
- Patent number 6,341,139
- Issue date Jan 22, 2002
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor laser pumped solid state laser
- Patent number 6,314,120
- Issue date Nov 6, 2001
- Fuji Photo Film Co., Ltd
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-diode-pumped solid state laser and radiation image read-out s...
- Patent number 6,058,126
- Issue date May 2, 2000
- Fuji Photo Film Co., Ltd.
- Hiromi Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-diode-pumped solid state laser
- Patent number 6,049,555
- Issue date Apr 11, 2000
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LOCALIZED PLASMON ENHANCING FLUORESCENCE PARTICLES, LOCALIZED PLASM...
- Publication number 20140030821
- Publication date Jan 30, 2014
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE DETECTING APPARATUS, SAMPLE CELL FOR DETECTING FLUORES...
- Publication number 20120322166
- Publication date Dec 20, 2012
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE DETECTING METHOD
- Publication number 20110129942
- Publication date Jun 2, 2011
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
DETECTING METHOD AND DIELECTRIC PARTICLES CONTAINING MAGNETIC MATER...
- Publication number 20110025315
- Publication date Feb 3, 2011
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MASS SPECTROMETRY, AND MASS SPECTROMETRY APPARATUS AND M...
- Publication number 20100065735
- Publication date Mar 18, 2010
- FUJIFILM CORPORATION
- Naoki Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING METHOD, DETECTING APPARATUS, DETECTION SAMPLE CELL, AND D...
- Publication number 20100047820
- Publication date Feb 25, 2010
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD, DETECTION APPARATUS, AND SAMPLE CELL AND KIT FOR...
- Publication number 20100006774
- Publication date Jan 14, 2010
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD, DETECTION APPARATUS, AND SAMPLE CELL AND KIT FOR...
- Publication number 20100009458
- Publication date Jan 14, 2010
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD, DETECTION APPARATUS, AND SAMPLE CELL AND KIT FOR...
- Publication number 20090321662
- Publication date Dec 31, 2009
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
DETECTING METHOD, DETECTION SAMPLE CELL, AND DETECTING KIT
- Publication number 20090321661
- Publication date Dec 31, 2009
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE DETECTING METHOD
- Publication number 20090283700
- Publication date Nov 19, 2009
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
IMMUNOCHROMATOASSAY METHOD AND IMMUNOCHROMATOASSAY KIT
- Publication number 20090258439
- Publication date Oct 15, 2009
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
Sensor Unit and Assay Method of Assay in Utilizing Attenuated Total...
- Publication number 20090195784
- Publication date Aug 6, 2009
- FUJIFILM CORPORATION
- Nobuhiko Ogura
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER FOR NEAR FIELD OPTICAL MICROSCOPES, PLASMON ENHANCED FLU...
- Publication number 20090101815
- Publication date Apr 23, 2009
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE SENSOR AND METHOD FOR PRODUCING THIN METAL FILM WITH A...
- Publication number 20090101836
- Publication date Apr 23, 2009
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
LOCAL PLASMON ENHANCED FLUORESCENCE SENSOR
- Publication number 20080219893
- Publication date Sep 11, 2008
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE SENSOR
- Publication number 20080204753
- Publication date Aug 28, 2008
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PLASMON ENHANCED FLUORESCENCE SENSOR
- Publication number 20080179540
- Publication date Jul 31, 2008
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PLASMON ENHANCED FLUORESCENCE SENSOR AND FLUORESCENCE DETEC...
- Publication number 20080074671
- Publication date Mar 27, 2008
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
Screening method and apparatus
- Publication number 20070172891
- Publication date Jul 26, 2007
- FUJIFILM CORPORATION
- Toshihito Kimura
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Base plate for use in mass spectrometry analysis, and method and ap...
- Publication number 20070158549
- Publication date Jul 12, 2007
- FUJIFILM CORPORATION
- Masayuki Naya
- G01 - MEASURING TESTING
Information Patent Application
Sensor unit and assay method of assay in utilizing attenuated total...
- Publication number 20060197954
- Publication date Sep 7, 2006
- Fuji Photo Film Co., Ltd.
- Nobuhiko Ogura
- G01 - MEASURING TESTING
Information Patent Application
Sensor unit for assay in utilizing attenuated total reflection
- Publication number 20060159591
- Publication date Jul 20, 2006
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
Measuring method and measuring apparatus utilizing attenuated total...
- Publication number 20060066861
- Publication date Mar 30, 2006
- Fuji Photo Film Co., Ltd.
- Shu Sato
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring reaction rate coefficient by surface plasmon r...
- Publication number 20060040326
- Publication date Feb 23, 2006
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring dissociation rate coefficient by surface plasm...
- Publication number 20060040409
- Publication date Feb 23, 2006
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
Measurement method and apparatus
- Publication number 20050168746
- Publication date Aug 4, 2005
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
Surface plasmon resonance sensor and sensor unit
- Publication number 20050112028
- Publication date May 26, 2005
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...
- Publication number 20050047468
- Publication date Mar 3, 2005
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...
- Publication number 20050047467
- Publication date Mar 3, 2005
- Fuji Photo Film Co., Ltd.
- Hisashi Ohtsuka
- H01 - BASIC ELECTRIC ELEMENTS

Hisashi Ohtsuka

Person

Patents Grantslast 30 patents

Detecting method and dielectric particles containing magnetic mater...

Device for mass spectrometry, and mass spectrometry apparatus and m...

Fluorescence detecting method

Immunochromatoassay method and immunochromatoassay kit

Detection method, detection apparatus, and sample cell and kit for...

Screening method and apparatus

Surface plasmon enhanced fluorescence sensor and fluorescence detec...

Sensor unit and assay method of assay in utilizing attenuated total...

Fluorescence sensor

Sensor unit for assay in utilizing attenuated total reflection

Base plate for use in mass spectrometry analysis, and method and ap...

Sensor unit and assay method of assay in utilizing attenuated total...

Method for measuring dissociation rate coefficient by surface plasm...

Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...

Method for measuring reaction rate coefficient by surface plasmon r...

Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...

Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...

Measuring method and measuring apparatus utilizing attenuated total...

Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...

Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...

Measurement method and apparatus

Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...

Measuring method and apparatus using attenuation in total internal...

LASER-DIODE-EXCITED LASER APPARATUS, FIBER LASER APPARATUS, AND FIB...

Solid-state laser apparatus excited by laser light from semiconduct...

Measuring method and apparatus using attenuation in total internal...

Semiconductor-laser-pumped solid state laser

Semiconductor laser pumped solid state laser

Laser-diode-pumped solid state laser and radiation image read-out s...

Laser-diode-pumped solid state laser

Patents Applicationslast 30 patents

LOCALIZED PLASMON ENHANCING FLUORESCENCE PARTICLES, LOCALIZED PLASM...

FLUORESCENCE DETECTING APPARATUS, SAMPLE CELL FOR DETECTING FLUORES...

FLUORESCENCE DETECTING METHOD

DETECTING METHOD AND DIELECTRIC PARTICLES CONTAINING MAGNETIC MATER...

DEVICE FOR MASS SPECTROMETRY, AND MASS SPECTROMETRY APPARATUS AND M...

DETECTING METHOD, DETECTING APPARATUS, DETECTION SAMPLE CELL, AND D...

DETECTION METHOD, DETECTION APPARATUS, AND SAMPLE CELL AND KIT FOR...

DETECTION METHOD, DETECTION APPARATUS, AND SAMPLE CELL AND KIT FOR...

DETECTION METHOD, DETECTION APPARATUS, AND SAMPLE CELL AND KIT FOR...

DETECTING METHOD, DETECTION SAMPLE CELL, AND DETECTING KIT

FLUORESCENCE DETECTING METHOD

IMMUNOCHROMATOASSAY METHOD AND IMMUNOCHROMATOASSAY KIT

Sensor Unit and Assay Method of Assay in Utilizing Attenuated Total...

CANTILEVER FOR NEAR FIELD OPTICAL MICROSCOPES, PLASMON ENHANCED FLU...

FLUORESCENCE SENSOR AND METHOD FOR PRODUCING THIN METAL FILM WITH A...

LOCAL PLASMON ENHANCED FLUORESCENCE SENSOR

FLUORESCENCE SENSOR

SURFACE PLASMON ENHANCED FLUORESCENCE SENSOR

SURFACE PLASMON ENHANCED FLUORESCENCE SENSOR AND FLUORESCENCE DETEC...

Screening method and apparatus

Base plate for use in mass spectrometry analysis, and method and ap...

Sensor unit and assay method of assay in utilizing attenuated total...

Sensor unit for assay in utilizing attenuated total reflection

Measuring method and measuring apparatus utilizing attenuated total...

Method for measuring reaction rate coefficient by surface plasmon r...

Method for measuring dissociation rate coefficient by surface plasm...

Measurement method and apparatus

Surface plasmon resonance sensor and sensor unit

Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...

Laser-diode-excited laser apparatus, fiber laser apparatus, and fib...