Hisashi Shiozawa

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for point diffraction interferometry
- Patent number 6,963,408
- Issue date Nov 8, 2005
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring interference and apparatus for measuring inter...
- Patent number 6,940,605
- Issue date Sep 6, 2005
- Nikon Corporation
- Jun Kawakami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for point diffraction interferometry
- Publication number 20040252311
- Publication date Dec 16, 2004
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring interference and apparatus for measuring inter...
- Publication number 20030174342
- Publication date Sep 18, 2003
- Jun Kawakami
- G01 - MEASURING TESTING