HISASHI YAMAUCHI

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TOKYO, JP

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Patents Grantslast 30 patents

Information Patent Grant
Delay test system for normal circuit
- Patent number 6,128,253
- Issue date Oct 3, 2000
- NEC Corporation
- Hisashi Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
LSI tester for use in LSI fault analysis
- Patent number 6,105,156
- Issue date Aug 15, 2000
- NEC Corporation
- Hisashi Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
CMOS integrated circuit testing method and apparatus using quiescen...
- Patent number 5,939,894
- Issue date Aug 17, 1999
- NEC Corporation
- Hisashi Yamauchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test control circuit for controlling a setting and resetting of a f...
- Patent number 5,467,354
- Issue date Nov 14, 1995
- NEC Corporation
- Hisashi Yamauchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cassette loading device for a cassette recording apparatus
- Patent number 4,287,541
- Issue date Sep 1, 1981
- Sony Corporation
- Makoto Tanahashi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method of generating test pattern for integrated circuit
- Publication number 20040153930
- Publication date Aug 5, 2004
- HISASHI YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
Scan path test method
- Publication number 20020199144
- Publication date Dec 26, 2002
- HISASHI YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF GENERATING TEST PATTERN FOR INTEGRATED CIRCUIT
- Publication number 20020046376
- Publication date Apr 18, 2002
- HISASHI YAMAUCHI
- G01 - MEASURING TESTING