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Hisato Takehara
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Specimen analyzer, abnormality control method of the same and compu...
Patent number
8,778,268
Issue date
Jul 15, 2014
Sysmex Corporation
Hisato Takehara
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer
Patent number
8,535,607
Issue date
Sep 17, 2013
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer
Patent number
8,425,839
Issue date
Apr 23, 2013
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and sample analyzing method
Patent number
8,366,998
Issue date
Feb 5, 2013
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and error information displaying method
Patent number
8,335,662
Issue date
Dec 18, 2012
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and method for analyzing samples
Patent number
8,329,103
Issue date
Dec 11, 2012
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzing apparatus
Patent number
8,279,715
Issue date
Oct 2, 2012
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer
Patent number
8,231,830
Issue date
Jul 31, 2012
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and sample analyzing method
Patent number
8,071,029
Issue date
Dec 6, 2011
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzing apparatus
Patent number
8,040,757
Issue date
Oct 18, 2011
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Grant
Analyzer and method of restarting sample measurement
Patent number
7,957,935
Issue date
Jun 7, 2011
Sysmex Corporation
Tomoyuki Nishida
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and error information displaying method
Patent number
7,707,010
Issue date
Apr 27, 2010
Sysmex Corporation
Yuji Wakamiya
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE ANALYZING APPARATUS
Publication number
20120004742
Publication date
Jan 5, 2012
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS APPARATUS, INFORMATION PROCESSING UNIT, AND AN INFORMATION...
Publication number
20110077871
Publication date
Mar 31, 2011
Daigo Fukuma
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND ERROR INFORMATION DISPLAYING METHOD
Publication number
20100238043
Publication date
Sep 23, 2010
Sysmex Corporation
Yuji Wakamiya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ANALYZER AND METHOD OF RESTARTING SAMPLE MEASUREMENT
Publication number
20090292492
Publication date
Nov 26, 2009
SYSMEX CORPORATION
Tomoyuki NISHIDA
G01 - MEASURING TESTING
Information
Patent Application
ANALYZER AND MEASUREMENT RESTARTING METHOD
Publication number
20090220379
Publication date
Sep 3, 2009
SYSMEX CORPORATION
Yuji WAKAMIYA
G01 - MEASURING TESTING
Information
Patent Application
Specimen analyzer, abnormality control method of the same and compu...
Publication number
20090215183
Publication date
Aug 27, 2009
Sysmex Corporation
Hisato Takehara
G01 - MEASURING TESTING
Information
Patent Application
Sample analyzer and sample analyzing method
Publication number
20090215184
Publication date
Aug 27, 2009
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Application
Sample analyzer and method for analyzing samples
Publication number
20090081794
Publication date
Mar 26, 2009
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Application
Sample analyzer and error information displaying method
Publication number
20090082984
Publication date
Mar 26, 2009
Sysmex Corporation
Yuji Wakamiya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Sample analyzing apparatus
Publication number
20080279048
Publication date
Nov 13, 2008
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER
Publication number
20080240988
Publication date
Oct 2, 2008
Yuji WAKAMIYA
G01 - MEASURING TESTING
Information
Patent Application
Sample Analyzer
Publication number
20080240984
Publication date
Oct 2, 2008
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Application
Sample Analyzer
Publication number
20080240991
Publication date
Oct 2, 2008
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING
Information
Patent Application
Sample analyzer and sample analyzing method
Publication number
20080241937
Publication date
Oct 2, 2008
Sysmex Corporation
Yuji Wakamiya
G01 - MEASURING TESTING