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Hisato Yoshida
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Kashihara-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor integrated circuit, and semiconductor system includin...
Patent number
7,343,547
Issue date
Mar 11, 2008
Matsushita Electric Industrial Co., Ltd.
Kimihiko Aiba
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit with CPU and FPGA for reserved instructions exec...
Patent number
6,901,502
Issue date
May 31, 2005
Matsushita Electric Industrial Co., Ltd.
Junichi Yano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electromagnetic disturbance analysis method and apparatus and semic...
Patent number
6,810,340
Issue date
Oct 26, 2004
Matsushita Electric Industrial Co., Ltd.
Kenji Shimazaki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Verification Apparatus and Verification Method
Publication number
20080221861
Publication date
Sep 11, 2008
Kei Yoneda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit, and semiconductor system includin...
Publication number
20060282721
Publication date
Dec 14, 2006
Kimihiko Aiba
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit
Publication number
20050144515
Publication date
Jun 30, 2005
Matsushita Electric Industrial Co., Ltd.
Junichi Yano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electromagnetic disturbance analysis method and apparatus and semic...
Publication number
20020147553
Publication date
Oct 10, 2002
Kenji Shimazaki
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit
Publication number
20020133690
Publication date
Sep 19, 2002
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Junichi Yano
G06 - COMPUTING CALCULATING COUNTING